Issued Patents 2005
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6914670 | Defect detection with enhanced dynamic range | Gilad Almogy, Boris Goldberg | 2005-07-05 |
| 6898304 | Hardware configuration for parallel data processing without cross communication | Vitaly Rubinovich | 2005-05-24 |
| 6882417 | Method and system for detecting defects | Boris Goldberg | 2005-04-19 |
| 6861660 | Process and assembly for non-destructive surface inspection | Gilad Almogy, Avishay Guetta, Doron Shoham | 2005-03-01 |
| 6853475 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Emanuel Elyasaf, Nissim Elmaliach, Boris Golberg, Silviu Reinhorn | 2005-02-08 |