Issued Patents 2005
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6946655 | Spot grid array electron imaging system | Oren Reches | 2005-09-20 |
| 6914670 | Defect detection with enhanced dynamic range | Boris Goldberg, Ron Naftali | 2005-07-05 |
| 6897941 | Optical spot grid array printer | — | 2005-05-24 |
| 6862491 | System and method for process variation monitor | Evgeni Levin, Efrat Rozenman | 2005-03-01 |
| 6861660 | Process and assembly for non-destructive surface inspection | Ron Naftali, Avishay Guetta, Doron Shoham | 2005-03-01 |
| 6853446 | Variable angle illumination wafer inspection system | Hadar Mazaki, Zvi Howard Phillip, Silviu Reinhorn, Boris Goldberg, Daniel I. Some | 2005-02-08 |
| 6841787 | Maskless photon-electron spot-grid array printer | — | 2005-01-11 |