Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6930770 | High throughput inspection system and method for generating transmitted and/or reflected images | Haim Feldman, Simon Yalov, Eitan Lahat | 2005-08-16 |
| 6853475 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Nissim Elmaliach, Ron Naftali, Boris Golberg, Silviu Reinhorn | 2005-02-08 |