Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6853475 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Emanuel Elyasaf, Nissim Elmaliach, Ron Naftali, Silviu Reinhorn | 2005-02-08 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6853475 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Emanuel Elyasaf, Nissim Elmaliach, Ron Naftali, Silviu Reinhorn | 2005-02-08 |