EV

Erik Volkerink

VP Verigy (Singapore) Pte.: 7 patents #5 of 115Top 5%
AD Advantest: 3 patents #330 of 1,193Top 30%
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VI Verigy Ipco: 1 patents #3 of 14Top 25%
📍 Palo Alto, CA: #1,509 of 9,675 inventorsTop 20%
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Overall (All Time): #291,520 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
11700063 Appliance remote control Miriam van Ringelestijn 2023-07-11
10819137 Energy harvesting wireless sensing system Ajay Khoche 2020-10-27
10025648 System, methods and apparatus using virtual appliances in a semiconductor test environment Klaus-Dieter Hilliges, Jia-Wei Lin, Duncan Gurley, Xiaomin Jin 2018-07-17
9429623 Solution for full speed, parallel DUT testing W Scott Villareal Filler, Ahmed S. Tantawy 2016-08-30
9335347 Method and apparatus for massively parallel multi-wafer test John Andberg, Ira Leventhal, Matthew Losey, Yohannes Desta, Lakshmikanth Namburi +2 more 2016-05-10
8797056 System and method for electronic testing of partially processed devices Ajay Khoche 2014-08-05
8347156 Test system and method for testing electronic devices using a pipelined testing architecture Edmundo De La Puente 2013-01-01
8320235 Self-repair system and method for providing resource failure tolerance Alan D. Hart 2012-11-27
7743304 Test system and method for testing electronic devices using a pipelined testing architecture Edmundo De La Puente 2010-06-22
7707468 System and method for electronic testing of multiple memory devices Duncan Gurley 2010-04-27
7590903 Re-configurable architecture for automated test equipment Hugh Wallace, Klaus-Dieter Hilliges, Ajay Khoche, Jochen Rivoir 2009-09-15
7412639 System and method for testing circuitry on a wafer Ajay Koche 2008-08-12
7386777 Systems and methods for processing automatically generated test patterns Klaus-Dieter Hilliges 2008-06-10
7378860 Wafer test head architecture and method of use Duncan Gurley, Ajay Khoche 2008-05-27
7279919 Systems and methods of allocating device testing resources to sites of a probe card Klaus-Dieter Hilliges, Edmundo De La Puente 2007-10-09
7131046 System and method for testing circuitry using an externally generated signature Ajay Khoche, Klaus-Dieter Hilliges 2006-10-31