Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12293802 | Memory queue operations to increase throughput in an ATE system | Srdjan Malisic | 2025-05-06 |
| 12216163 | Systems and methods of testing devices using CXL for increased parallelism | — | 2025-02-04 |
| 12079098 | Automated test equipment with hardware accelerator | Mei-Mei Su, Eddy Wayne Chow | 2024-09-03 |
| 10914784 | Method and apparatus for providing UFS terminated and unterminated pulse width modulation support using dual channels | Andrew K. Chan, Preet Paul Singh, Sivanarayana Pandian Rajadurai | 2021-02-09 |
| 9612272 | Testing memory devices with parallel processing operations | Xinguo Zhang, Michael Jones, Ken Hanh Duc Lai, Alan S. Krech, Jr. | 2017-04-04 |
| 9557372 | Tester having an application specific electronics module, and systems and methods that incorporate or use the same | Ken Hanh Duc Lai | 2017-01-31 |
| 9330792 | Testing memory devices with distributed processing operations | Xinguo Zhang, Ze'ev Raz, Ken Hanh Duc Lai | 2016-05-03 |
| 8384410 | Parallel test circuit with active devices | David Eskeldson | 2013-02-26 |
| 8347156 | Test system and method for testing electronic devices using a pipelined testing architecture | Erik Volkerink | 2013-01-01 |
| 8242796 | Transmit/receive unit, and methods and apparatus for transmitting signals between transmit/receive units | David Eskeldson | 2012-08-14 |
| 8149901 | Channel switching circuit | Robert Pochowski | 2012-04-03 |
| 7928755 | Methods and apparatus that selectively use or bypass a remote pin electronics block to test at least one device under test | David Eskeldson | 2011-04-19 |
| 7743304 | Test system and method for testing electronic devices using a pipelined testing architecture | Erik Volkerink | 2010-06-22 |
| 7480583 | Methods and apparatus for testing a circuit | — | 2009-01-20 |
| 7279919 | Systems and methods of allocating device testing resources to sites of a probe card | Erik Volkerink, Klaus-Dieter Hilliges | 2007-10-09 |
| 7262620 | Resource matrix, system, and method for operating same | Alan D. Hart | 2007-08-28 |
| 7076714 | Memory tester uses arbitrary dynamic mappings to serialize vectors into transmitted sub-vectors and de-serialize received sub-vectors into vectors | John Howard Cook, III, Alan S. Krech, Jr., Stephen D Jordan, John M Freesman | 2006-07-11 |
| 6779140 | Algorithmically programmable memory tester with test sites operating in a slave mode | Alan S. Krech, Jr., Joel Buck-Gengler | 2004-08-17 |
| 6671844 | Memory tester tests multiple DUT's per test site | Alan S. Krech, Jr., John M Freeseman, Randy L. Bailey | 2003-12-30 |
| 6320812 | Error catch RAM for memory tester has SDRAM memory sets configurable for size and speed | John Howard Cook, III, Preet Paul Singh | 2001-11-20 |