Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320851 | Software and firmware support for device interface board configured to allow devices supporting multiple different standards to interface with the same socket | Chi Yuan, Linden Hsu | 2025-06-03 |
| 12140609 | Universal test interface systems and methods | — | 2024-11-12 |
| 12079098 | Automated test equipment with hardware accelerator | Eddy Wayne Chow, Edmundo De La Puente | 2024-09-03 |
| 12055581 | Software directed firmware acceleration | Duane Champoux, Linden Hsu, Srdjan Malisic | 2024-08-06 |
| 11860229 | Device interface board supporting devices with multiple different standards to interface with the same socket | — | 2024-01-02 |
| 11714132 | Test equipment diagnostics systems and methods | Seth Craighead | 2023-08-01 |
| 11619667 | Enhanced loopback diagnostic systems and methods | Seth Craighead | 2023-04-04 |
| 11099228 | Test system and method | — | 2021-08-24 |
| 11041907 | Method and system for acquisition of test data | Ben Rogel-Favila, John K. Frediani, Shunji Tachibana | 2021-06-22 |
| 11009550 | Test architecture with an FPGA based test board to simulate a DUT or end-point | Duane Champoux | 2021-05-18 |
| 11002787 | Scalable platform for system level testing | Roland Wolff, Ben Rogel-Favila | 2021-05-11 |
| 10929260 | Traffic capture and debugging tools for identifying root causes of device failure during automated testing | Linden Hsu, Ben Rogel-Favila, Michael Jones, Duane Champoux | 2021-02-23 |
| 10634723 | Method and system for acquisition of test data | Ben Rogel-Favila, John K. Frediani, Shunji Tachibana | 2020-04-28 |
| 10288681 | Test architecture with a small form factor test board for rapid prototyping | Duane Champoux | 2019-05-14 |
| 10241146 | Test system and method | Ben Rogel-Favila | 2019-03-26 |
| 10162007 | Test architecture having multiple FPGA based hardware accelerator blocks for testing multiple DUTs independently | Gerald Chan, Eric Barr Kushnick, Andrew Niemic | 2018-12-25 |
| 9933454 | Universal test floor system | Ben Rogel-Favila, Roland Wolff, Eric Barr Kushnick, James Fishman | 2018-04-03 |
| 9310427 | High speed tester communication interface between test slice and trays | Eric Barr Kushnick, Roland Wolff | 2016-04-12 |
| 7865788 | Dynamic mask memory for serial scan testing | Phillip D. Burlison, John K. Frediani | 2011-01-04 |