Mei-Mei Su — 20 Patents at Advantest

Mei-Mei Su has been granted 20 US patents while listed as an inventor at Advantest. The first was granted in 2011 and the most recent in October 2025. Mei-Mei Su ranks #214,803 of 4,157,543 US inventors in our database (top 5.2%). Patent records list Mei-Mei Su in San Jose, CA, US.

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12436186	Self-reset testing systems and methods	Camilo Montenegro, Lizst Hsu	2025-10-07
12320851	Software and firmware support for device interface board configured to allow devices supporting multiple different standards to interface with the same socket	Chi Yuan, Linden Hsu	2025-06-03
12140609	Universal test interface systems and methods	—	2024-11-12
12079098	Automated test equipment with hardware accelerator	Eddy Wayne Chow, Edmundo De La Puente	2024-09-03
12055581	Software directed firmware acceleration	Duane Champoux, Linden Hsu, Srdjan Malisic	2024-08-06
11860229	Device interface board supporting devices with multiple different standards to interface with the same socket	—	2024-01-02
11714132	Test equipment diagnostics systems and methods	Seth Craighead	2023-08-01
11619667	Enhanced loopback diagnostic systems and methods	Seth Craighead	2023-04-04
11099228	Test system and method	—	2021-08-24
11041907	Method and system for acquisition of test data	Ben Rogel-Favila, John K. Frediani, Shunji Tachibana	2021-06-22
11009550	Test architecture with an FPGA based test board to simulate a DUT or end-point	Duane Champoux	2021-05-18
11002787	Scalable platform for system level testing	Roland Wolff, Ben Rogel-Favila	2021-05-11
10929260	Traffic capture and debugging tools for identifying root causes of device failure during automated testing	Linden Hsu, Ben Rogel-Favila, Michael Jones, Duane Champoux	2021-02-23
10634723	Method and system for acquisition of test data	Ben Rogel-Favila, John K. Frediani, Shunji Tachibana	2020-04-28
10288681	Test architecture with a small form factor test board for rapid prototyping	Duane Champoux	2019-05-14
10241146	Test system and method	Ben Rogel-Favila	2019-03-26
10162007	Test architecture having multiple FPGA based hardware accelerator blocks for testing multiple DUTs independently	Gerald Chan, Eric Barr Kushnick, Andrew Niemic	2018-12-25
9933454	Universal test floor system	Ben Rogel-Favila, Roland Wolff, Eric Barr Kushnick, James Fishman	2018-04-03
9310427	High speed tester communication interface between test slice and trays	Eric Barr Kushnick, Roland Wolff	2016-04-12	$70,000
7865788	Dynamic mask memory for serial scan testing	Phillip D. Burlison, John K. Frediani	2011-01-04	$9,945,000

Mei-Mei Su — 20 Patents

Issued Patents All Time

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