| 12135352 |
Random number generation testing systems and methods |
Marilyn Kushnick |
2024-11-05 |
| 12055581 |
Software directed firmware acceleration |
Linden Hsu, Srdjan Malisic, Mei-Mei Su |
2024-08-06 |
| 11237202 |
Non-standard sector size system support for SSD testing |
Srdjan Malisic |
2022-02-01 |
| 11137910 |
Fast address to sector number/offset translation to support odd sector size testing |
— |
2021-10-05 |
| 11009550 |
Test architecture with an FPGA based test board to simulate a DUT or end-point |
Mei-Mei Su |
2021-05-18 |
| 10955461 |
Smart and efficient protocol logic analyzer configured within automated test equipment (ATE) hardware |
Linden Hsu, Ben Rogel-Favila |
2021-03-23 |
| 10929260 |
Traffic capture and debugging tools for identifying root causes of device failure during automated testing |
Linden Hsu, Ben Rogel-Favila, Michael Jones, Mei-Mei Su |
2021-02-23 |
| 10884847 |
Fast parallel CRC determination to support SSD testing |
— |
2021-01-05 |
| 10379158 |
Real-time capture of traffic upon failure for protocol debug |
— |
2019-08-13 |
| 10288681 |
Test architecture with a small form factor test board for rapid prototyping |
Mei-Mei Su |
2019-05-14 |
| 5925145 |
Integrated circuit tester with cached vector memories |
Gregory Illes, Kenneth L. Skala, Richard B. Morris |
1999-07-20 |
| 5894484 |
Integrated circuit tester with distributed instruction processing |
Gregory Illes, Kenneth L. Skala, Richard B. Morris |
1999-04-13 |
| 5838694 |
Dual source data distribution system for integrated circuit tester |
Gregory Illes, Kenneth L. Skala, Richard B. Morris |
1998-11-17 |
| 5805610 |
Virtual channel data distribution system for integrated circuit tester |
Gregory Illes, Kenneth L. Skala, Richard B. Morris |
1998-09-08 |