Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8127186 | Methods and apparatus for estimating a position of a stuck-at defect in a scan chain of a device under test | John K. Frediani | 2012-02-28 |
| 8006149 | System and method for device performance characterization in physical and logical domains with AC SCAN testing | Richard C. Dokken, Gerald Chan | 2011-08-23 |
| 7865788 | Dynamic mask memory for serial scan testing | Mei-Mei Su, John K. Frediani | 2011-01-04 |
| 7650547 | Apparatus for locating a defect in a scan chain while testing digital logic | John K. Frediani | 2010-01-19 |
| 7191368 | Single platform electronic tester | Donald V. Organ, Kenneth J. Lanier, Roger W. Blethen, H. Neil Kelly, Michael G. Davis +8 more | 2007-03-13 |
| 7114114 | Dynamically reconfigurable precision signal delay test system for automatic test equipment | Jason E. Doege | 2006-09-26 |
| 7092837 | Single platform electronic tester | Kenneth J. Lanier, Roger W. Blethen, H. Neil Kelly, Michael G. Davis, Jeffrey H. Perkins +7 more | 2006-08-15 |
| 7032145 | System for dynamic re-allocation of test pattern data for parallel and serial test data patterns | — | 2006-04-18 |
| 7013417 | Dynamically reconfigurable precision signal delay test system for automatic test equipment | Jason E. Doege | 2006-03-14 |
| 6880137 | Dynamically reconfigurable precision signal delay test system for automatic test equipment | Jason E. Doege | 2005-04-12 |
| 6675339 | Single platform electronic tester | Kenneth J. Lanier, Roger W. Blethen, H. Neil Kelly, Michael G. Davis, Jeffrey H. Perkins +7 more | 2004-01-06 |
| 6449741 | Single platform electronic tester | Donald V. Organ, Kenneth J. Lanier, Roger W. Blethen, H. Neil Kelly, Michael G. Davis +8 more | 2002-09-10 |
| 5694063 | High speed I.sub.DDQ monitor circuit | William R. DeHaven, Victor Pogrebinsky | 1997-12-02 |
| 5552744 | High speed I.sub.DDQ monitor circuit | William R. DeHaven, Victor Pogrebinsky | 1996-09-03 |
| 5200696 | Test system apparatus with Schottky diodes with programmable voltages | David Menis, Harold S. Vitale, William R. DeHaven | 1993-04-06 |