| 8127186 |
Methods and apparatus for estimating a position of a stuck-at defect in a scan chain of a device under test |
John K. Frediani |
2012-02-28 |
| 8006149 |
System and method for device performance characterization in physical and logical domains with AC SCAN testing |
Richard C. Dokken, Gerald Chan |
2011-08-23 |
| 7865788 |
Dynamic mask memory for serial scan testing |
Mei-Mei Su, John K. Frediani |
2011-01-04 |
| 7650547 |
Apparatus for locating a defect in a scan chain while testing digital logic |
John K. Frediani |
2010-01-19 |
| 7191368 |
Single platform electronic tester |
Donald V. Organ, Kenneth J. Lanier, Roger W. Blethen, H. Neil Kelly, Michael G. Davis +8 more |
2007-03-13 |
| 7114114 |
Dynamically reconfigurable precision signal delay test system for automatic test equipment |
Jason E. Doege |
2006-09-26 |
| 7092837 |
Single platform electronic tester |
Kenneth J. Lanier, Roger W. Blethen, H. Neil Kelly, Michael G. Davis, Jeffrey H. Perkins +7 more |
2006-08-15 |
| 7032145 |
System for dynamic re-allocation of test pattern data for parallel and serial test data patterns |
— |
2006-04-18 |
| 7013417 |
Dynamically reconfigurable precision signal delay test system for automatic test equipment |
Jason E. Doege |
2006-03-14 |
| 6880137 |
Dynamically reconfigurable precision signal delay test system for automatic test equipment |
Jason E. Doege |
2005-04-12 |
| 6675339 |
Single platform electronic tester |
Kenneth J. Lanier, Roger W. Blethen, H. Neil Kelly, Michael G. Davis, Jeffrey H. Perkins +7 more |
2004-01-06 |
| 6449741 |
Single platform electronic tester |
Donald V. Organ, Kenneth J. Lanier, Roger W. Blethen, H. Neil Kelly, Michael G. Davis +8 more |
2002-09-10 |
| 5694063 |
High speed I.sub.DDQ monitor circuit |
William R. DeHaven, Victor Pogrebinsky |
1997-12-02 |
| 5552744 |
High speed I.sub.DDQ monitor circuit |
William R. DeHaven, Victor Pogrebinsky |
1996-09-03 |
| 5200696 |
Test system apparatus with Schottky diodes with programmable voltages |
David Menis, Harold S. Vitale, William R. DeHaven |
1993-04-06 |