Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8615691 | Process for improving design-limited yield by localizing potential faults from production test data | Gerald Chan, John C. Potter, Alfred L. Crouch | 2013-12-24 |
| 8453026 | Process for improving design limited yield by efficiently capturing and storing production test data for analysis using checksums, hash values, or digital fault signatures | Gerald Chan | 2013-05-28 |
| 8060851 | Method for operating a secure semiconductor IP server to support failure analysis | Gerald Chan, Jacob J Orbon, Alfred L. Crouch | 2011-11-15 |
| 8010856 | Methods for analyzing scan chains, and for determining numbers or locations of hold time faults in scan chains | Stephen A. Cannon, Alfred L. Crouch, Gary A. Winblad | 2011-08-30 |
| 8006149 | System and method for device performance characterization in physical and logical domains with AC SCAN testing | Gerald Chan, Phillip D. Burlison | 2011-08-23 |
| 7853846 | Locating hold time violations in scan chains by generating patterns on ATE | Stephen A. Cannon, Alfred L. Crouch, Gary A. Winblad | 2010-12-14 |
| 7568139 | Process for identifying the location of a break in a scan chain in real time | Gerald Chan, Takehiko Ishii | 2009-07-28 |
| 7047463 | Method and system for automatically determining a testing order when executing a test flow | Donald V. Organ | 2006-05-16 |