Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10652131 | Method and apparatus to provide both high speed and low speed signaling from the high speed transceivers on an field programmable gate array | Michael Jones, Alan S. Krech, Jr. | 2020-05-12 |
| 10162007 | Test architecture having multiple FPGA based hardware accelerator blocks for testing multiple DUTs independently | Gerald Chan, Mei-Mei Su, Andrew Niemic | 2018-12-25 |
| 10161962 | Universal test cell | Ben Rogel-Favila, Roland Wolff, James Fishman | 2018-12-25 |
| 9995767 | Universal container for device under test | Ben Rogel-Favila, Roland Wolff, James Fishman | 2018-06-12 |
| 9933454 | Universal test floor system | Ben Rogel-Favila, Roland Wolff, James Fishman, Mei-Mei Su | 2018-04-03 |
| 9310427 | High speed tester communication interface between test slice and trays | Mei-Mei Su, Roland Wolff | 2016-04-12 |
| 8504867 | High resolution clock signal generator | — | 2013-08-06 |
| 8327090 | Histogram generation with mixed binning memory | Michael Jones | 2012-12-04 |
| 8312327 | Correcting apparatus, PDF measurement apparatus, jitter measurement apparatus, jitter separation apparatus, electric device, correcting method, program, and recording medium | Harry Hou, Takahiro Yamaguchi, Masahiro Ishida | 2012-11-13 |
| 7996168 | Method and apparatus for time vernier calibration | — | 2011-08-09 |
| 7805628 | High resolution clock signal generator | — | 2010-09-28 |
| 7684280 | Histogram generation with banks for improved memory access performance | Michael Jones | 2010-03-23 |
| 7672805 | Synchronization of modules for analog and mixed signal testing in an open architecture test system | Kenji Inaba, Toshiyuki Miura | 2010-03-02 |
| 7620858 | Fabric-based high speed serial crossbar switch for ATE | — | 2009-11-17 |
| 7606849 | Method and apparatus for improving the frequency resolution of a direct digital synthesizer | — | 2009-10-20 |
| 7463018 | Carrier module for adapting non-standard instrument cards to test systems | Yasuo Furukawa, Lawrence Kraus, James Getchell | 2008-12-09 |
| 7362089 | Carrier module for adapting non-standard instrument cards to test systems | Yasuo Furukawa, Lawrence Kraus, James Getchell | 2008-04-22 |
| 5694377 | Differential time interpolator | — | 1997-12-02 |