| 10652131 |
Method and apparatus to provide both high speed and low speed signaling from the high speed transceivers on an field programmable gate array |
Michael Jones, Alan S. Krech, Jr. |
2020-05-12 |
| 10162007 |
Test architecture having multiple FPGA based hardware accelerator blocks for testing multiple DUTs independently |
Gerald Chan, Mei-Mei Su, Andrew Niemic |
2018-12-25 |
| 10161962 |
Universal test cell |
Ben Rogel-Favila, Roland Wolff, James Fishman |
2018-12-25 |
| 9995767 |
Universal container for device under test |
Ben Rogel-Favila, Roland Wolff, James Fishman |
2018-06-12 |
| 9933454 |
Universal test floor system |
Ben Rogel-Favila, Roland Wolff, James Fishman, Mei-Mei Su |
2018-04-03 |
| 9310427 |
High speed tester communication interface between test slice and trays |
Mei-Mei Su, Roland Wolff |
2016-04-12 |
| 8504867 |
High resolution clock signal generator |
— |
2013-08-06 |
| 8327090 |
Histogram generation with mixed binning memory |
Michael Jones |
2012-12-04 |
| 8312327 |
Correcting apparatus, PDF measurement apparatus, jitter measurement apparatus, jitter separation apparatus, electric device, correcting method, program, and recording medium |
Harry Hou, Takahiro Yamaguchi, Masahiro Ishida |
2012-11-13 |
| 7996168 |
Method and apparatus for time vernier calibration |
— |
2011-08-09 |
| 7805628 |
High resolution clock signal generator |
— |
2010-09-28 |
| 7684280 |
Histogram generation with banks for improved memory access performance |
Michael Jones |
2010-03-23 |
| 7672805 |
Synchronization of modules for analog and mixed signal testing in an open architecture test system |
Kenji Inaba, Toshiyuki Miura |
2010-03-02 |
| 7620858 |
Fabric-based high speed serial crossbar switch for ATE |
— |
2009-11-17 |
| 7606849 |
Method and apparatus for improving the frequency resolution of a direct digital synthesizer |
— |
2009-10-20 |
| 7463018 |
Carrier module for adapting non-standard instrument cards to test systems |
Yasuo Furukawa, Lawrence Kraus, James Getchell |
2008-12-09 |
| 7362089 |
Carrier module for adapting non-standard instrument cards to test systems |
Yasuo Furukawa, Lawrence Kraus, James Getchell |
2008-04-22 |
| 5694377 |
Differential time interpolator |
— |
1997-12-02 |