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Programming multiple serial input devices |
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Parallel test circuit with active devices |
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Edmundo De La Puente |
2012-08-14 |
| 7928755 |
Methods and apparatus that selectively use or bypass a remote pin electronics block to test at least one device under test |
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2011-04-19 |
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Method and structure for AC coupled insitu ESD protection |
John C. Kerley |
2008-02-19 |
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Bounding box signal detector |
Glenn Wood |
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Eye diagram analyzer correctly samples low dv/dt voltages |
Richard Nygaard |
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Probe for testing circuits, and associated methods |
Brent Holcombe, Bobby Self, Emad Soubh |
2005-03-15 |
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Distributed capacitive/resistive electronic device |
Martin L. Guth |
2005-03-08 |
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Eye diagram analyzer with fixed data channel delays and swept clock channel delay |
Richard Nygaard |
2004-07-27 |
| 6483284 |
Wide-bandwidth probe using pole-zero cancellation |
Steven D. Draving, Kenneth McClellan Rush |
2002-11-19 |