BH

Brent Holcombe

AT Agilent Technologies: 19 patents #54 of 3,411Top 2%
Overall (All Time): #181,406 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDate
12172488 Retractably extendable trailing axle 2024-12-24
11827072 Retractably extendable trailing axle 2023-11-28
10472176 Modular conveyor assembly cassette James K. Brewster 2019-11-12
9616592 Modular conveyor assembly cassette James K. Brewster 2017-04-11
7492173 Probe accessories, and methods for probing test points using same Brock J. LaMeres, Kenneth W. Johnson 2009-02-17
7372284 Method and apparatus for probing at arbitrary locations within an inaccessible array of leads the solder balls or pins actually connecting a VLSI IC package to a substrate or socket Brock J. LaMeres, Kenneth W. Johnson 2008-05-13
7323892 Probe having a frame to align spring pins perpendicularly to a printed circuit board, and method of making same Brock J. LaMeres 2008-01-29
7282935 Regenerator probe Glenn Wood, Donald M. Logelin, Brock J. LaMeres 2007-10-16
7242202 Signal probe and probe assembly Joseph Groshong, Brock J. LaMeres 2007-07-10
7242203 Probe retention kit, and system and method for probing a pattern of points on a printed circuit board Brock J. LaMeres, Kenneth W. Johnson 2007-07-10
7183781 Incorporation of isolation resistor(s) into probes using probe tip spring pins Brock J. LaMeres, Glenn Wood 2007-02-27
7145352 Apparatus, method, and kit for probing a pattern of points on a printed circuit board Brock J. LaMeres, Kenneth W. Johnson 2006-12-05
7116121 Probe assembly with controlled impedance spring pin or resistor tip spring pin contacts Brock J. LaMeres, Donald M. Logelin 2006-10-03
7091731 Flexible ribbon probe for peripheral leads of an electronic part's package Perry M. Keller 2006-08-15
7064567 Interposer probe and method for testing Donald E. Schott, Peter J. Martinez 2006-06-20
7046020 Probes with perpendicularly disposed spring pins, and methods of making and using same Brock J. LaMeres, Kenneth W. Johnson 2006-05-16
6867609 Probe for testing circuits, and associated methods David Eskeldson, Bobby Self, Emad Soubh 2005-03-15
6822466 Alignment/retention device for connector-less probe Brock J. LaMeres 2004-11-23
6750669 Method for constructing a flex-rigid laminate probe 2004-06-15
6638080 Integrated ball grid array-pin grid array-flex laminate test assembly Kenneth W. Johnson 2003-10-28
6635511 Integrated ball grid array-pin grid array-flex circuit interposing probe assembly 2003-10-21
6396698 Retention module adapter 2002-05-28
6378757 Method for edge mounting flex media to a rigid PC board Steven D. Draving 2002-04-30