Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11913990 | Automated test equipment for testing one or more devices under test, method for automated testing of one or more devices under test, and computer program for handling command errors | Olaf PÖPPE, Alan S. Krech, Jr. | 2024-02-27 |
| 11415628 | Automated test equipment for testing one or more devices under test, method for automated testing of one or more devices under test, and computer program using a buffer memory | Olaf PÖPPE, Alan S. Krech, Jr. | 2022-08-16 |
| 11385285 | Automated test equipment using an on-chip-system test controller | Olaf PÖPPE | 2022-07-12 |
| 10025648 | System, methods and apparatus using virtual appliances in a semiconductor test environment | Jia-Wei Lin, Duncan Gurley, Xiaomin Jin, Erik Volkerink | 2018-07-17 |
| 9317351 | System, methods and apparatus using virtual appliances in a semiconductor test environment | Jia-Wei Lin, Duncan Gurley, Jim-my Jin, Eric Vokerink | 2016-04-19 |
| 7797599 | Diagnostic information capture from logic devices with built-in self test | Ajay Khoche | 2010-09-14 |
| 7712000 | ATE architecture and method for DFT oriented testing | Ajay Khoche | 2010-05-04 |
| 7590903 | Re-configurable architecture for automated test equipment | Erik Volkerink, Hugh Wallace, Ajay Khoche, Jochen Rivoir | 2009-09-15 |
| 7571363 | Parametric measurement of high-speed I/O systems | Hugh Wallace, Adrian Wan-Chew Seet | 2009-08-04 |
| 7386777 | Systems and methods for processing automatically generated test patterns | Erik Volkerink | 2008-06-10 |
| 7279919 | Systems and methods of allocating device testing resources to sites of a probe card | Erik Volkerink, Edmundo De La Puente | 2007-10-09 |
| 7184469 | Systems and methods for injection of test jitter in data bit-streams | Francis Joseph, Cheryl L. Owen | 2007-02-27 |
| 7131046 | System and method for testing circuitry using an externally generated signature | Erik Volkerink, Ajay Khoche | 2006-10-31 |
| 6966018 | Integrated circuit tester with multi-port testing functionality | — | 2005-11-15 |