Issued Patents All Time
Showing 25 most recent of 50 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12124359 | Systems and methods for device testing to avoid resource conflicts for a large number of test scenarios | — | 2024-10-22 |
| 11200156 | Tester and method for testing a device under test using relevance scores | — | 2021-12-14 |
| 11187743 | Automated test equipment for combined signals | Andreas Hantsch | 2021-11-30 |
| 11182274 | Test apparatus for performing a test on a device under test and data set filter for filtering a data set to obtain a best setting of a device under test | — | 2021-11-23 |
| 11105855 | Tester and method for testing a device under test and tester and method for determining a single decision function | — | 2021-08-31 |
| 11036623 | Test apparatus and method for characterizing a device under test | — | 2021-06-15 |
| 10775437 | Test apparatus and method for testing a device under test | — | 2020-09-15 |
| 9847843 | Apparatus and method for wireless testing of a plurality of transmit paths and a plurality of receive paths of an electronic device | Markus Rottacker, Andreas Hantsch | 2017-12-19 |
| 9658282 | Techniques for determining a fault probability of a location on a chip | — | 2017-05-23 |
| 9575726 | Bit sequence generator and apparatus for calculating a sub-rate transition matrix and a sub-rate initial state for a state machine of a plurality of state machines | — | 2017-02-21 |
| 9341673 | Device under test data processing techniques | — | 2016-05-17 |
| 9164726 | Apparatus for determining a number of successive equal bits preceding an edge within a bit stream and apparatus for reconstructing a repetitive bit sequence | Markus Seuring | 2015-10-20 |
| 9140750 | Apparatus comprising a recursive delayer and method for measuring a phase noise | Marco Pausini | 2015-09-22 |
| 9103887 | Method and apparatus for adjusting transitions in a bit stream | — | 2015-08-11 |
| 8886987 | Data processing unit and a method of processing data | — | 2014-11-11 |
| 8880574 | State machine and generator for generating a description of a state machine feedback function | — | 2014-11-04 |
| 8838406 | Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipment | — | 2014-09-16 |
| 8825424 | Apparatus and method for estimating data relating to a time difference and apparatus and method for calibrating a delay line | — | 2014-09-02 |
| 8797046 | Method of sharing a test resource at a plurality of test sites, automated test equipment, handler for loading and unloading devices to be tested and test system | Markus Rottacker | 2014-08-05 |
| 8745568 | Method and apparatus for determining relevance values for a detection of a fault on a chip and for determining a fault probability of a location on a chip | — | 2014-06-03 |
| 8418010 | Format transformation of test data | — | 2013-04-09 |
| 8378707 | Evaluation of an output signal of a device under test | — | 2013-02-19 |
| 8253605 | Decorrelation of data by using this data | — | 2012-08-28 |
| 8169212 | Calibrating signals by time adjustment | — | 2012-05-01 |
| 7847716 | Asynchronous sigma-delta digital-analog converter | — | 2010-12-07 |