JR

Jochen Rivoir

AD Advantest: 14 patents #53 of 1,193Top 5%
AT Agilent Technologies: 12 patents #128 of 3,411Top 4%
AP Advantest (Singapore) Pte: 10 patents #1 of 43Top 3%
VP Verigy (Singapore) Pte.: 10 patents #1 of 115Top 1%
HP HP: 2 patents #2,312 of 7,018Top 35%
📍 Magstadt, CA: #1 of 1 inventorsTop 100%
Overall (All Time): #54,261 of 4,157,543Top 2%
50
Patents All Time

Issued Patents All Time

Showing 26–50 of 50 patents

Patent #TitleCo-InventorsDate
7791525 Time-to-digital conversion with calibration pulse injection 2010-09-07
7782242 Time-to-digital conversion with delay contribution determination of delay elements 2010-08-24
7672804 Analog signal test using a-priori information 2010-03-02
7590903 Re-configurable architecture for automated test equipment Erik Volkerink, Hugh Wallace, Klaus-Dieter Hilliges, Ajay Khoche 2009-09-15
7512858 Method and system for per-pin clock synthesis of an electronic device under test 2009-03-31
7434118 Parameterized signal conditioning Marc Moessinger, Dieter Ohnesorge, Christoph Zender, Bernd Laquai, Markus Rottacker +3 more 2008-10-07
7414558 Digital to analog conversion using summation of multiple DACs Holger Engelhard 2008-08-19
7366937 Fast synchronization of a number of digital clocks 2008-04-29
7333042 Method and system for digital to analog conversion using multi-purpose current summation 2008-02-19
7248200 Analog to digital conversion method using track/hold circuit and time interval analyzer, and an apparatus using the method Takanori Komuro 2007-07-24
7248660 Transition tracking 2007-07-24
7230556 Analog signal generation using a delta-sigma modulator 2007-06-12
7137053 Bandwidth matching for scan architectures in an integrated circuit Ajay Khoche, David Armstrong 2006-11-14
7136770 Using component-level calibration data to reduce system-level test John McLaughlin, Joseph M. Gorin, Moray Rumney, Matthew A. Johnson, Robert J. Locascio +3 more 2006-11-14
7119720 Precision pulse placement to form a binary pulse signal 2006-10-10
6993695 Method and apparatus for testing digital devices using transition timestamps 2006-01-31
6972704 Sigma-delta modulator with PWM output 2005-12-06
6735728 Unidirectional verification of bus-based systems Herbert Tiedemann, Tilmann Wendel 2004-05-11
6732312 Test vector compression method Ajay Khoche 2004-05-04
6717540 Signal preconditioning for analog-to-digital conversion with timestamps Linda A. Kamas 2004-04-06
6489802 Digital signal transition splitting method and apparatus Ajay Khoche 2002-12-03
6462693 Analog to digital signal conversion method and apparatus 2002-10-08
6429799 Method and apparatus for analog to digital conversion using time-varying reference signal Linda A. Kamas 2002-08-06
6105087 Event recognition by a state machine whose state is dependent upon historical information 2000-08-15
6098186 Test permutator 2000-08-01