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Test equipment, method for operating a test equipment and computer program |
Stefan Gross, Ingolf Martin, Alfred Rosenkränzer, Detlef Müller |
2020-09-08 |
| 10234498 |
Automated test equipment for testing a device under test and method for testing a device under test |
Jonas Horst, Heinz Nuessle |
2019-03-19 |
| 9954546 |
Removal of sampling clock jitter induced in an output signal of an analog-to-digital converter |
— |
2018-04-24 |
| 9300309 |
Apparatus and method for source synchronous testing of signal converters |
— |
2016-03-29 |
| 8933718 |
Signal distribution structure and method for distributing a signal |
— |
2015-01-13 |
| 8326565 |
Chip tester, method for providing timing information, test fixture set, apparatus for post-processing propagation delay information, method for post-processing delay information, chip test set up and method for testing devices under test |
Michael Daub, Alf Clement |
2012-12-04 |
| 7434118 |
Parameterized signal conditioning |
Marc Moessinger, Dieter Ohnesorge, Christoph Zender, Markus Rottacker, Jochen Rivoir +3 more |
2008-10-07 |
| 7355378 |
Source synchronous sampling |
Markus Rottacker, Klaus-Peter Behrens |
2008-04-08 |
| 7260493 |
Testing a device under test by sampling its clock and data signal |
Joerg-Walter Mohr |
2007-08-21 |
| 7062393 |
Polynomial fit for jitter separation |
— |
2006-06-13 |
| 6961745 |
Filter for injecting data dependent jitter and level noise |
— |
2005-11-01 |