Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9885752 | Test apparatus for generating reference scan chain test data and test system | Michael Braun | 2018-02-06 |
| 9164726 | Apparatus for determining a number of successive equal bits preceding an edge within a bit stream and apparatus for reconstructing a repetitive bit sequence | Jochen Rivoir | 2015-10-20 |
| 8307249 | At-speed bitmapping in a memory built-in self-test by locking an N-TH failure | Kay Hesse, Kai Eichhorn | 2012-11-06 |
| 7689884 | Multicore chip test | — | 2010-03-30 |
| 7673208 | Storing multicore chip test data | — | 2010-03-02 |
| 7653845 | Test algorithm selection in memory built-in self test controller | Siegfried Kay Hesse, Thomas Herrmann | 2010-01-26 |
| 7340658 | Technique for combining scan test and memory built-in self test | — | 2008-03-04 |