Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 9885752 | Test apparatus for generating reference scan chain test data and test system | Michael Braun | 2018-02-06 | |
| 9164726 | Apparatus for determining a number of successive equal bits preceding an edge within a bit stream and apparatus for reconstructing a repetitive bit sequence | Jochen Rivoir | 2015-10-20 | $109,000 |
| 8307249 | At-speed bitmapping in a memory built-in self-test by locking an N-TH failure | Kay Hesse, Kai Eichhorn | 2012-11-06 | $1,379,000 |
| 7689884 | Multicore chip test | — | 2010-03-30 | $12,072,000 |
| 7673208 | Storing multicore chip test data | — | 2010-03-02 | $5,781,000 |
| 7653845 | Test algorithm selection in memory built-in self test controller | Siegfried Kay Hesse, Thomas Herrmann | 2010-01-26 | $13,320,000 |
| 7340658 | Technique for combining scan test and memory built-in self test | — | 2008-03-04 | $9,869,000 |