| 6920596 |
Method and apparatus for determining fault sources for device failures |
Arman Sagatelian, Alvin Jee, Julie Segal, Yervant David Lepejian |
2005-07-19 |
| 6780656 |
Correction of overlay offset between inspection layers |
David J. Muradian, Brian Duffy, Julie Segal |
2004-08-24 |
| 6745370 |
Method for selecting an optimal level of redundancy in the design of memories |
Julie Segal, David Lepejian |
2004-06-01 |
| 6574140 |
Low voltage single supply CMOS electrically erasable read-only memory |
— |
2003-06-03 |
| 6534816 |
Method and apparatus for injecting charge onto the floating gate of a nonvolatile memory cell |
— |
2003-03-18 |
| 6479863 |
Method and apparatus for injecting charge onto the floating gate of a nonvolatile memory cell |
— |
2002-11-12 |
| 6451652 |
Method for forming an EEPROM cell together with transistor for peripheral circuits |
Gregorio Spadea |
2002-09-17 |
| 6411545 |
Non-volatile latch |
— |
2002-06-25 |
| 6384451 |
Method and apparatus for injecting charge onto the floating gate of a nonvolatile memory cell |
— |
2002-05-07 |
| 6201732 |
Low voltage single CMOS electrically erasable read-only memory |
— |
2001-03-13 |
| 6096093 |
Method for using inspection data for improving throughput of stepper operations in manufacturing of integrated circuits |
David Lepejian |
2000-08-01 |
| 6092030 |
Timing delay generator and method including compensation for environmental variation |
Yervant David Lepejian, Lawrence Kraus, Julie Segal |
2000-07-18 |
| 5986931 |
Low voltage single CMOS electrically erasable read-only memory |
— |
1999-11-16 |
| 5974579 |
Efficient built-in self test for embedded memories with differing address spaces |
Yervant David Lepejian, Hrant Marandjian, Hovhannes Ghukasyan, Lawrence Kraus |
1999-10-26 |
| 5790455 |
Low voltage single supply CMOS electrically erasable read-only memory |
— |
1998-08-04 |
| 5764096 |
General purpose, non-volatile reprogrammable switch |
Robert J. Lipp, Richard D. Freeman, Robert U. Broze, Joseph G. Nolan, III |
1998-06-09 |
| 5621738 |
Method for programming flash EEPROM devices |
Jagdish Pathak |
1997-04-15 |
| 5475695 |
Automatic failure analysis system |
Alan B. Helffrich, III, Yervant David Lepejian |
1995-12-12 |
| 5270980 |
Sector erasable flash EEPROM |
Jagdish Pathak, Timothy J. Tredwell, Constantine N. Anagnostopoulos |
1993-12-14 |
| 5235544 |
Flash EPROM cell and method for operating same |
— |
1993-08-10 |
| 5161157 |
Field-programmable redundancy apparatus for memory arrays |
William H. Owen, Joseph Drori, James M. Jaffe, Isao Nojima, Jeffrey Sung +1 more |
1992-11-03 |
| 5153880 |
Field-programmable redundancy apparatus for memory arrays |
William H. Owen, Joseph Drori, James M. Jaffe, Isao Nojima, Jeffrey Sung +1 more |
1992-10-06 |
| 5070480 |
Nonvolatile associative memory system |
— |
1991-12-03 |
