Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12208483 | Microreplicated polishing surface with enhanced co-planarity | Kenneth A. P. Meyer, John J. Sullivan, Brian W. Lueck, Duy K. Lehuu, David F. Slama | 2025-01-28 |
| 6780656 | Correction of overlay offset between inspection layers | John Caywood, Brian Duffy, Julie Segal | 2004-08-24 |
| 6586263 | Correction of overlay offset between inspection layers in integrated circuits | Arman Sagatelian | 2003-07-01 |