Issued Patents All Time
Showing 26–50 of 66 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8845163 | LED-based photolithographic illuminator with high collection efficiency | David G. Stites | 2014-09-30 |
| 8823921 | Programmable illuminator for a photolithography system | Borislav Zlatanov | 2014-09-02 |
| 8796053 | Photolithographic LED fabrication using phase-shift mask | Robert L. Hsieh, Warren W. Flack | 2014-08-05 |
| 8796151 | Systems for and methods of laser-enhanced plasma processing of semiconductor materials | Arthur W. Zafiropoulo | 2014-08-05 |
| 8781213 | Optical alignment systems for forming LEDs having a rough surface | Robert L. Hsieh, Khiem Nguyen, Warren W. Flack | 2014-07-15 |
| 8765493 | Methods of characterizing semiconductor light-emitting devices based on product wafer characteristics | David Owen | 2014-07-01 |
| 8742286 | Apparatus and method for improving the intensity profile of a beam image used to process a substrate | Boris Grek, David A. Markle | 2014-06-03 |
| 8658451 | Activating GaN LEDs by laser spike annealing and flash annealing | Yun Wang | 2014-02-25 |
| 8592309 | Laser spike annealing for GaN LEDs | Yun Wang | 2013-11-26 |
| 8460959 | Fast thermal annealing of GaN LEDs | Yun Wang | 2013-06-11 |
| 8309474 | Ultrafast laser annealing with reduced pattern density effects in integrated circuit fabrication | Yun Wang | 2012-11-13 |
| 8299446 | Sub-field enhanced global alignment | Emily True, Manish Ranjan, Warren W. Flack, Detlef Fuchs | 2012-10-30 |
| 8153930 | Apparatus and methods for improving the intensity profile of a beam image used to process a substrate | Boris Grek, David A. Markle | 2012-04-10 |
| 8088633 | Optical alignment methods for forming LEDs having a rough surface | Robert L. Hsieh, Khiem Nguyen, Warren W. Flack | 2012-01-03 |
| 8067305 | Electrically conductive structure on a semiconductor substrate formed from printing | Arthur W. Zafiropoulo | 2011-11-29 |
| 7960993 | Method for capacitive testing of flat panel displays | David W. Gardner | 2011-06-14 |
| 7514305 | Apparatus and methods for improving the intensity profile of a beam image used to process a substrate | Boris Grek, David A. Markle | 2009-04-07 |
| 7466161 | Direct detect sensor for flat panel displays | David W. Gardner | 2008-12-16 |
| 6825101 | Methods for annealing a substrate and article produced by such methods | David A. Markle, Somit Talwar | 2004-11-30 |
| 6671235 | Method of and apparatus for defining disk tracks in magnetic recording media | Robert D. Hempstead, David A. Markle | 2003-12-30 |
| 6635588 | Method for laser thermal processing using thermally induced reflectivity switch | Somit Talwar, Yun Wang, Michael O. Thompson | 2003-10-21 |
| 6617600 | Radiation shield device and method | Joe Gortych, Yu Chue Fong | 2003-09-09 |
| 6570656 | Illumination fluence regulation system and method for use in thermal processing employed in the fabrication of reduced-dimension integrated circuits | James B. Owens, Jr., Somit Talwar, Yun Wang | 2003-05-27 |
| 6554464 | Apparatus for and method of reducing or eliminating interference effects in a light tunnel illuminator | Yu Chue Fong, David G. Stites, Weijian Wang | 2003-04-29 |
| 6531681 | Apparatus having line source of radiant energy for exposing a substrate | David A. Markle, Hwan J. Jeong | 2003-03-11 |