Issued Patents All Time
Showing 1–25 of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11406528 | Cold and hot thermal treatment device | — | 2022-08-09 |
| 11243480 | System for making accurate grating patterns using multiple writing columns each making multiple scans | David A. Markle | 2022-02-08 |
| 10617641 | Composition for preventing or treating ischemic diseases, containing liposomes in which VEGF-derived peptides are supported | — | 2020-04-14 |
| 10500411 | Cancer cell growth inhibition and killing device using blue light LED | — | 2019-12-10 |
| 9662990 | Door assembly for charging port of electric vehicle | Yong-Won Jeong, Yong Suk Shin, Young Ik Cho | 2017-05-30 |
| 9304410 | Apparatus and method of direct writing with photons beyond the diffraction limit | David A. Markle, Rudolf H. Hendel, John S. Petersen | 2016-04-05 |
| 9189705 | Phase-controlled model-based overlay measurement systems and methods | — | 2015-11-17 |
| 9075013 | Apparatus and methods for microscopy having resolution beyond the Abbe limit | David A. Markle, John S. Petersen | 2015-07-07 |
| 8817273 | Dark field diffraction based overlay | Silvio J. Rabello, Thomas Andre Casavant | 2014-08-26 |
| 8642232 | Method of direct writing with photons beyond the diffraction limit | David A. Markle, Rudolf H. Hendel, John S. Petersen | 2014-02-04 |
| 8559014 | High-resolution, common-path interferometric imaging systems and methods | David A. Markle | 2013-10-15 |
| 7986412 | Interferometric defect detection and classification | — | 2011-07-26 |
| 7864334 | Interferometric defect detection | — | 2011-01-04 |
| 7397557 | Serrated Fourier filters and inspection systems | Andrew V. Hill, Mark Wang | 2008-07-08 |
| 7199946 | Systems configured to provide illumination of a specimen during inspection | — | 2007-04-03 |
| 6907167 | Optical interleaving with enhanced spectral response and reduced polarization sensitivity | Xing Chen | 2005-06-14 |
| 6751373 | Wavelength division multiplexing with narrow band reflective filters | — | 2004-06-15 |
| 6531681 | Apparatus having line source of radiant energy for exposing a substrate | David A. Markle, Andrew M. Hawryluk | 2003-03-11 |
| 6381077 | Scanning microlithographic apparatus and method for projecting a large field-of-view image on a substrate | David A. Markle | 2002-04-30 |
| 6142641 | Four-mirror extreme ultraviolet (EUV) lithography projection system | Simon Jason Cohen, David Shafer | 2000-11-07 |
| 5852693 | Low-loss light redirection apparatus | — | 1998-12-22 |
| 5822066 | Point diffraction interferometer and pin mirror for use therewith | David A. Markle | 1998-10-13 |
| 5621813 | Pattern recognition alignment system | Robert L. Brown, David A. Markle, David S. Pan, Richard B. Ward, Mark S. Wanta | 1997-04-15 |
| 5557469 | Beamsplitter in single fold optical system and optical variable magnification method and system | David A. Markle | 1996-09-17 |
| 5402205 | Alignment system for a Half-Field Dyson projection system | David A. Markle, Gerald Alonzo | 1995-03-28 |