Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9935022 | Systems and methods of characterizing process-induced wafer shape for process control using CGS interferometry | — | 2018-04-03 |
| 8765493 | Methods of characterizing semiconductor light-emitting devices based on product wafer characteristics | Andrew M. Hawryluk | 2014-07-01 |
| 8398849 | Application of visbreaker analysis tools to optimize performance | Collin Wade Cross, Andre Vanhove | 2013-03-19 |
| 7517458 | Process obtaining landfill disposable wasted from hydrocarbon containing sludge | — | 2009-04-14 |
| 7433051 | Determination of lithography misalignment based on curvature and stress mapping data of substrates | — | 2008-10-07 |
| 7369251 | Full-field optical measurements of surface properties of panels, substrates and wafers | Ares J. Rosakis, Stephen Gledden, Sean Olson | 2008-05-06 |
| 6469788 | Coherent gradient sensing ellipsometer | David A. Boyd, Ares J. Rosakis | 2002-10-22 |
| 5942086 | Application of material to a substrate | — | 1999-08-24 |
| D390104 | Container for a potato or other vegetable | — | 1998-02-03 |
| 5685952 | Deinking of paper using magnetic forces | — | 1997-11-11 |