| 9935022 |
Systems and methods of characterizing process-induced wafer shape for process control using CGS interferometry |
— |
2018-04-03 |
| 8765493 |
Methods of characterizing semiconductor light-emitting devices based on product wafer characteristics |
Andrew M. Hawryluk |
2014-07-01 |
| 8398849 |
Application of visbreaker analysis tools to optimize performance |
Collin Wade Cross, Andre Vanhove |
2013-03-19 |
| 7517458 |
Process obtaining landfill disposable wasted from hydrocarbon containing sludge |
— |
2009-04-14 |
| 7433051 |
Determination of lithography misalignment based on curvature and stress mapping data of substrates |
— |
2008-10-07 |
| 7369251 |
Full-field optical measurements of surface properties of panels, substrates and wafers |
Ares J. Rosakis, Stephen Gledden, Sean Olson |
2008-05-06 |
| 6469788 |
Coherent gradient sensing ellipsometer |
David A. Boyd, Ares J. Rosakis |
2002-10-22 |
| 5942086 |
Application of material to a substrate |
— |
1999-08-24 |
| D390104 |
Container for a potato or other vegetable |
— |
1998-02-03 |
| 5685952 |
Deinking of paper using magnetic forces |
— |
1997-11-11 |
