SA

Shingo Asaumi

TC Tokyo Ohka Kogyo Co.: 11 patents #109 of 684Top 20%
Overall (All Time): #474,363 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
5281508 Positive-working photoresist containing o-naphthoquinone diazide sulfonic acid ester and novolak resin consisting of 35 to 43% m-cresol and 65 to 57% p-cresol with substantial absence of o-cresol Hidekatsu Kohara, Hatsuyuki Tanaka, Masanori Miyabe, Yoshiaki Arai, Toshimasa Nakayama +2 more 1994-01-25
4906549 Positive-working photoresist composition with quinone diazide sulfonic acid ester and novolac made from m-cresol, p-cresol and aliphatic phenol with 2-6 carbon atoms Hidekatsu Kohara, Hatsuyuki Tanaka, Masanori Miyabe, Toshimasa Nakayama 1990-03-06
4882260 Positive-working photosensitive quinone diazide composition with alkali insoluble dye and alkali soluble dye Hidekatsu Kohara, Nobuo Tokutake, Masanori Miyabe, Toshimasa Nakayama, Hatsuyuki Tanaka +1 more 1989-11-21
4844832 Containing an arylsulfonic acid, a phenol and a naphalenic solvent Masakazu Kobayashi, Akira Yokota, Hisashi Nakane 1989-07-04
4833067 Developing solution for positive-working photoresist comprising tmah and non-ionic surfactant Hatsuyuki Tanaka, Hidekatsu Kohara, Yoshiyuki Sato, Toshimasa Nakayama, Akira Yokota +1 more 1989-05-23
4824762 Method for rinse treatment of a substrate Masakazu Kobayashi, Hatsuyuki Tanaka 1989-04-25
4804612 Highly heat-resistant positive-working o-quinone diazide containing photoresist composition with novolac resin made from phenol with ethylenic unsaturation Hidekatsu Kohara, Hatsuyuki Tanaka, Toshimasa Nakayama 1989-02-14
4784937 Developing solution for positive-working photoresist comprising a metal ion free organic base and an anionic surfactant Hatsuyuki Tanaka, Hidekatsu Kohara, Yoshiyuki Sato, Toshimasa Nakayama, Akira Yokota +1 more 1988-11-15
4738915 Positive-working O-quinone diazide photoresist composition with 2,3,4-trihydroxybenzophenone Takashi Komine, Akira Yokota, Hisashi Nakane 1988-04-19
4731319 Positive-working naphthoquinone diazide photoresist composition with two cresol novolac resins Hidekatsu Kohara, Hatsuyuki Tanaka, Masanori Miyabe, Yoshiaki Arai, Toshimasa Nakayama 1988-03-15
4385086 Method for preventing leaching of contaminants from solid surfaces Muneo Nakayama, Hisashi Nakane, Akira Yokota 1983-05-24