SZ

Song Zhao

TI Texas Instruments: 15 patents #889 of 12,488Top 8%
Huawei: 6 patents #2,214 of 15,535Top 15%
SC Shanghai Biren Technology Co.: 5 patents #6 of 31Top 20%
NP Nhwa Pharma.: 5 patents #4 of 41Top 10%
HT Huazhong University Of Science And Technology: 3 patents #108 of 1,292Top 9%
QU Qualcomm: 2 patents #5,578 of 12,104Top 50%
CL China Telecom Corporation Limited: 2 patents #13 of 56Top 25%
BU Beihang University: 1 patents #185 of 638Top 30%
SI Shanghai Institute Of Pharmaceutical Industry: 1 patents #53 of 174Top 35%
📍 Shanghai, TX: #23 of 161 inventorsTop 15%
Overall (All Time): #91,837 of 4,157,543Top 3%
36
Patents All Time

Issued Patents All Time

Showing 26–36 of 36 patents

Patent #TitleCo-InventorsDate
8355062 Method and apparatus for processing image Jing Wang, Yuan Liu, Kai Li 2013-01-15
8125035 CMOS fabrication process Mahalingam Nandakumar, Amitabh Jain 2012-02-28
8101476 Stress memorization dielectric optimized for NMOS and PMOS Kanan Garg, Haowen Bu, Mahalingam Nandakumar 2012-01-24
7897496 Semiconductor doping with reduced gate edge diode leakage Puneet Kohli, Nandakumar Mahalingam, Manoj Mehrotra 2011-03-01
7678637 CMOS fabrication process Mahalingam Nandakumar, Amitabh Jain 2010-03-16
7216310 Design method and system for optimum performance in integrated circuits that use power management Amitava Chatterjee, David B. Scott, Theodore W. Houston, Shaoping Tang, Zhiqiang Wu 2007-05-08
7211481 Method to strain NMOS devices while mitigating dopant diffusion for PMOS using a capped poly layer Manoj Mehrotra, Lahir Shaik Adam, Mahalingam Nandakumar 2007-05-01
7029967 Silicide method for CMOS integrated circuits Sue Crank, Amitava Chatterjee, Kaiping Liu, Jiong-Ping Lu, Donald Miles +2 more 2006-04-18
6855984 Process to reduce gate edge drain leakage in semiconductor devices Zhiqiang Wu, Shaoping Tang 2005-02-15
6822297 Additional n-type LDD/pocket implant for improving short-channel NMOS ESD robustness Mahalingam Nandakumar, Youngmin Kim 2004-11-23
6452236 Channel implant for improving NMOS ESD robustness Mahalingam Nadakumar 2002-09-17