MM

Mehrdad M. Moslehi

TI Texas Instruments: 85 patents #51 of 12,488Top 1%
SO Solexel: 63 patents #1 of 38Top 3%
CP Cvc Products: 39 patents #1 of 31Top 4%
SI Sigmagen: 10 patents #1 of 4Top 25%
CV Cvc: 9 patents #1 of 6Top 20%
OR Ob Realty: 7 patents #1 of 29Top 4%
Tesla: 3 patents #232 of 838Top 30%
TT Trutag Technologies: 3 patents #6 of 25Top 25%
Stanford University: 3 patents #828 of 5,197Top 20%
IN Intel: 2 patents #13,213 of 30,777Top 45%
VI Veeco Instruments: 1 patents #165 of 323Top 55%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
📍 Los Altos, CA: #14 of 3,651 inventorsTop 1%
🗺 California: #394 of 386,348 inventorsTop 1%
Overall (All Time): #2,283 of 4,157,543Top 1%
237
Patents All Time

Issued Patents All Time

Showing 176–200 of 237 patents

Patent #TitleCo-InventorsDate
5446824 Lamp-heated chuck for uniform wafer processing 1995-08-29
5444815 Multi-zone lamp interference correction system Yong Jin Lee 1995-08-22
5443315 Multi-zone real-time emissivity correction system Yong Jin Lee 1995-08-22
5436494 Temperature sensor calibration wafer structure and method of fabrication 1995-07-25
5435379 Method and apparatus for low-temperature semiconductor processing Habib N. Najm, Ajit Paranjpe, Cecil J. Davis 1995-07-25
5436172 Real-time multi-zone semiconductor wafer temperature and process uniformity control system 1995-07-25
5420056 Junction contact process and structure for semiconductor technologies 1995-05-30
5410162 Apparatus for and method of rapid testing of semiconductor components at elevated temperature Howard L. Tigelaar 1995-04-25
5405492 Method and apparatus for time-division plasma chopping in a multi-channel plasma processing equipment 1995-04-11
5405444 Process chamber purge module for semiconductor processing equipment 1995-04-11
5403434 Low-temperature in-situ dry cleaning process for semiconductor wafer 1995-04-04
5400209 In-situ real-time sheet resistance measurement system and method using an electrostatic chuck 1995-03-21
5397962 Source and method for generating high-density plasma with inductive power coupling 1995-03-14
5397909 High-performance insulated-gate field-effect transistor 1995-03-14
5387538 Method of fabrication of integrated circuit isolation structure 1995-02-07
5377071 Sensor apparatus and method for real-time in-situ measurements of sheet resistance and its uniformity pattern in semiconductor processing equipment 1994-12-27
5373184 SOI/semiconductor heterostructure fabrication by wafer bonding 1994-12-13
5372969 Low-RC multi-level interconnect technology for high-performance integrated circuits 1994-12-13
5367606 Multi-zone illuminator with embedded process control sensors Robert T. Matthews, Cecil J. Davis 1994-11-22
5354443 Method and apparatus for physical-vapor deposition of material layers 1994-10-11
5326170 Wireless temperature calibration device and method Habib N. Najm, Lino Velo 1994-07-05
5322809 Self-aligned silicide process 1994-06-21
5321298 Soi wafer fabrication by selective epitaxial growth 1994-06-14
5317656 Fiber optic network for multi-point emissivity-compensated semiconductor wafer pyrometry Habib N. Najm 1994-05-31
5305417 Apparatus and method for determining wafer temperature using pyrometry Habib N. Najm, Somnath Banerjee, Lino Velo 1994-04-19