HE

Henry Litzmann Edwards

TI Texas Instruments: 125 patents #23 of 12,488Top 1%
Airbus Operations Limited: 13 patents #72 of 3,269Top 3%
📍 Garland, TX: #2 of 1,186 inventorsTop 1%
🗺 Texas: #230 of 125,132 inventorsTop 1%
Overall (All Time): #7,301 of 4,157,543Top 1%
138
Patents All Time

Issued Patents All Time

Showing 126–138 of 138 patents

Patent #TitleCo-InventorsDate
7696049 Method to manufacture LDMOS transistors with improved threshold voltage control Binghua Hu, Howard S. Lee, John Lin, Vladimir Bolkhovsky 2010-04-13
7692217 Matched analog CMOS transistors with extension wells Hisashi Shichijo, Tathagata Chatterjee, Shyh-Horng Yang, Lance Robertson 2010-04-06
7687856 Body bias to facilitate transistor matching Tathagata Chatterjee, Mohamed Kamel Mahmoud, Xiaoju Wu 2010-03-30
7683364 Gated quantum resonant tunneling diode using CMOS transistor with modified pocket and LDD implants Chris Bowen, Tathagata Chatterjee 2010-03-23
7638415 Method for reducing dislocation threading using a suppression implant Martin B. Mollat, Tathagata Chatterjee, Lance Robertson, Richard B. Irwin, Binghua Hu 2009-12-29
7595649 Method to accurately estimate the source and drain resistance of a MOSFET Tathagata Chatterjee, Joe R. Trogolo, Kaiyuan Chen 2009-09-29
7466009 Method for reducing dislocation threading using a suppression implant Martin B. Mollat, Tathagata Chatterjee, Lance Robertson, Richard B. Irwin, Binghua Hu 2008-12-16
7141455 Method to manufacture LDMOS transistors with improved threshold voltage control Binghua Hu, Howard S. Lee, John Lin, Vladimir Bolkhovsky 2006-11-28
7091556 High voltage drain-extended transistor Sameer Pendharker 2006-08-15
6867100 System for high-precision double-diffused MOS transistors Sameer Pendharkar, Joe R. Trogolo, Tathagata Chatterjee, Taylor R. Efland 2005-03-15
6561868 System and method for controlling a polishing machine Sung-Jen Fang, Thomas M. Moore 2003-05-13
6555476 Silicon carbide as a stop layer in chemical mechanical polishing for isolation dielectric Leif C. Olsen, Leland Swanson 2003-04-29
6498502 Apparatus and method for evaluating semiconductor structures and devices Theodore S. Moise, Glen Wilk 2002-12-24