Issued Patents All Time
Showing 226–250 of 306 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7189627 | Method to improve SRAM performance and stability | Shaofeng Yu, C. Rinn Cleavelin | 2007-03-13 |
| 7129582 | Reducing the migration of grain boundaries | Kaiping Liu, Jihong Chen | 2006-10-31 |
| 7118979 | Method of manufacturing transistor having germanium implant region on the sidewalls of the polysilicon gate electrode | Kaiping Liu, Majid Movahed Mansoorz | 2006-10-10 |
| 7038258 | Semiconductor device having a localized halo implant therein and method of manufacture therefor | Kaiping Liu | 2006-05-02 |
| 6955980 | Reducing the migration of grain boundaries | Kaiping Liu, Jihong Chen | 2005-10-18 |
| 6940137 | Semiconductor device having an angled compensation implant and method of manufacture therefor | Jihong Chen, Kaiping Liu | 2005-09-06 |
| 6933203 | Methods for improving well to well isolation | Shaoping Tang, Jau-Yuann Yang | 2005-08-23 |
| 6913980 | Process method of source drain spacer engineering to improve transistor capacitance | Jihong Chen, Kaiping Liu | 2005-07-05 |
| 6885542 | Capacitor structure | Kunal R. Parekh, Li Li | 2005-04-26 |
| 6875650 | Eliminating substrate noise by an electrically isolated high-voltage I/O transistor | Craig T. Salling | 2005-04-05 |
| 6855984 | Process to reduce gate edge drain leakage in semiconductor devices | Shaoping Tang, Song Zhao | 2005-02-15 |
| 6831337 | Transistor circuit with varying resistance lightly doped diffused regions for electrostatic discharge (“ESD”) protection | David B. Scott | 2004-12-14 |
| 6820502 | High resolution pressure-sensing device having an insulating flexible matrix loaded with filler particles | Tongbi Jiang | 2004-11-23 |
| 6794235 | Method of manufacturing a semiconductor device having a localized halo implant | Kaiping Liu | 2004-09-21 |
| 6787839 | Capacitor structure | Kunal R. Parekh, Li Li | 2004-09-07 |
| 6788552 | Method and apparatus for reducing substrate bias voltage drop | Tongbi Jiang | 2004-09-07 |
| 6764909 | Structure and method of MOS transistor having increased substrate resistance | Craig T. Salling, Che-Jen Hu | 2004-07-20 |
| 6740923 | Capacitor structure | Kunal R. Parekh, Li Li | 2004-05-25 |
| 6730582 | Transistor circuit with varying resistance lightly doped diffused regions for electrostatic discharge (ESD) protection | David B. Scott | 2004-05-04 |
| 6730556 | Complementary transistors with controlled drain extension overlap | Che-Jen Hu | 2004-05-04 |
| 6727131 | System and method for addressing junction capacitances in semiconductor devices | Kaiping Liu | 2004-04-27 |
| 6724050 | ESD improvement by a vertical bipolar transistor with low breakdown voltage and high beta | Craig T. Salling | 2004-04-20 |
| 6723616 | Process of increasing screen dielectric thickness | Seetharaman Sridhar, Youngmin Kim, Mark S. Rodder | 2004-04-20 |
| 6713360 | System for reducing segregation and diffusion of halo implants into highly doped regions | Amitabh Jain, Kaiping Liu | 2004-03-30 |
| 6684717 | High resolution pressure-sensing device having an insulating flexible matrix loaded with filler particles | Tongbi Jiang | 2004-02-03 |