Issued Patents All Time
Showing 76–100 of 118 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9385208 | Semiconductor device having high-K gate dielectric layer | Kun-Yu Lee, Liang-Gi Yao, Clement Hsingjen Wann | 2016-07-05 |
| 9373549 | Semiconductor device and method of forming the same | Clement Hsingjen Wann, Chih-Hao Chang, Shou-Zen Chang, Chih-Hsin Ko, Andrew Joseph Kelly | 2016-06-21 |
| 9362123 | Structure and method for integrated devices on different substartes with interfacial engineering | Liang-Gi Yao, I-Ming Chang, Chih-Hao Chang, Shou-Zen Chang, Clement Hsingjen Wann | 2016-06-07 |
| 9349659 | Methods for probing semiconductor fins and determining carrier concentrations therein | Clement Hsingjen Wann, Ling-Yen Yeh, Chi-Yuan Shih, Yuan Shao, Wei-Chun Tsai | 2016-05-24 |
| 9257349 | Method of scavenging impurities in forming a gate stack having an interfacial layer | Kuan-Ting Liu, Liang-Gi Yao, Clement Hsingjen Wann | 2016-02-09 |
| 9240484 | FinFET with metal gate stressor | Andrew Joseph Kelly, Pei-Shan Chien, Wei-Hsiung Tseng | 2016-01-19 |
| 9202788 | Multi-layer semiconductor device structure | Yi-Tang Lin | 2015-12-01 |
| 9194804 | Stress analysis of 3-D structures using tip-enhanced Raman scattering technology | Liang-Gi Yao, Wei-Shan Hu, Yusuke Oniki, Ling-Yen Yeh, Clement Hsingjen Wann | 2015-11-24 |
| 9093335 | Calculating carrier concentrations in semiconductor Fins using probed resistance | Clement Hsingjen Wann, Ling-Yen Yeh, Chi-Yuan Shih, Yuan Shao, Wei-Chun Tsai | 2015-07-28 |
| 9054213 | FinFET with metal gate stressor | Andrew Joseph Kelly, Pei-Shan Chien, Wei-Hsiung Tseng | 2015-06-09 |
| 8987095 | Method of fabricating a carbon-free dielectric layer over a carbon-doped dielectric layer | Kun-Yu Lee, Liang-Gi Yao, Clement Hsingjen Wann | 2015-03-24 |
| 8872284 | FinFET with metal gate stressor | Andrew Joseph Kelly, Pei-Shan Chien, Wei-Hsiung Tseng | 2014-10-28 |
| 8766379 | Multi-layer scavenging metal gate stack for ultra-thin interfacial dielectric layer | Kuan-Ting Liu, Liang-Gi Yao, Clement Hsingjen Wann | 2014-07-01 |
| 8759920 | Semiconductor device and method of forming the same | Clement Hsingjen Wann, Chih-Hao Chang, Shou-Zen Chang, Chih-Hsin Ko, Andrew Joseph Kelly | 2014-06-24 |
| 7800181 | Semiconductor device and method for fabricating the same | Michikazu Matsumoto, Masafumi Kubota, Seiji Ueda, Hiroshi Iwai, Kazuo Tsutsui +1 more | 2010-09-21 |
| 7655483 | Electronic device and manufacturing method thereof | — | 2010-02-02 |
| 7585767 | Semiconductor device and method for fabricating the same | Michikazu Matsumoto | 2009-09-08 |
| 7517760 | Semiconductor device manufacturing method including three gate insulating films | Hideyuki Arai, Takashi Nakabayashi | 2009-04-14 |
| 7446015 | Semiconductor device and method for manufacturing the same | Masaru Yamada | 2008-11-04 |
| 7276769 | Semiconductor integrated circuit device | Masaru Yamada | 2007-10-02 |
| 7253436 | Resistance defect assessment device, resistance defect assessment method, and method for manufacturing resistance defect assessment device | Michikazu Matsumoto, Katsuyoshi Joukyu, Tetsuya Matsutani | 2007-08-07 |
| 7249343 | In-plane distribution data compression method, in-plane distribution measurement method, in-plane distribution optimization method, process apparatus control method, and process control method | — | 2007-07-24 |
| 7202147 | Semiconductor device and method for fabricating the same | Michikazu Matsumoto | 2007-04-10 |
| 7202095 | Method for measuring silicide proportion, method for measuring annealing temperature, method for fabricating semiconductor device and x-ray photo receiver | Akihiko Tsuzumitani | 2007-04-10 |
| 7196346 | Semiconductor memory device and method for fabricating the same | — | 2007-03-27 |