Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12053777 | Devices and methods for detecting cancerous cells | Shang-Cheng Hung, Yen-Chun KO, Cheng-Fang Tsai, Gwo-Bin Lee | 2024-08-06 |
| 11549946 | Method for detecting cholangiocarcinoma cells | Gwo-Bin Lee, Shang-Cheng Hung | 2023-01-10 |
| 11450661 | Forming STI regions to separate semiconductor Fins | Chih-Yu Hsu, Yi-Tang Lin, Clement Hsingjen Wann, Chih-Sheng Chang, Jyh-Cherng Sheu +1 more | 2022-09-20 |
| 10943995 | Self-aligned passivation of active regions | Clement Hsingjen Wann, Ling-Yen Yeh, Chi-Yuan Shih | 2021-03-09 |
| 10535573 | System and method for test key characterizing wafer processing state | Clement Hsingjen Wann, Ling-Yen Yeh, Chi-Yuan Shih | 2020-01-14 |
| 10269666 | System and method for test key characterizing wafer processing state | Clement Hsingjen Wann, Ling-Yen Yeh, Chi-Yuan Shih | 2019-04-23 |
| 10164070 | Self-aligned passivation of active regions | Clement Hsingjen Wann, Ling-Yen Yeh, Chi-Yuan Shih | 2018-12-25 |
| 10032889 | Self-aligned passivation of active regions | Clement Hsingjen Wann, Ling-Yen Yeh, Chi-Yuan Shih | 2018-07-24 |
| 9953975 | Methods for forming STI regions in integrated circuits | Chih-Yu Hsu, Yi-Tang Lin, Clement Hsinjen Wann, Chih-Sheng Chang, Jyh-Cherng Sheu +1 more | 2018-04-24 |
| 9627280 | Methods for probing semiconductor fins through four-point probe and determining carrier concentrations | Clement Hsingjen Wann, Yasutoshi Okuno, Ling-Yen Yeh, Chi-Yuan Shih, Yuan Shao | 2017-04-18 |
| 9431288 | System and method for test key characterizing wafer processing state | Clement Hsingjen Wann, Ling-Yen Yeh, Chi-Yuan Shih | 2016-08-30 |
| 9412847 | Self-aligned passivation of active regions | Clement Hsingjen Wann, Ling-Yen Yeh, Chi-Yuan Shih | 2016-08-09 |
| 9349659 | Methods for probing semiconductor fins and determining carrier concentrations therein | Clement Hsingjen Wann, Yasutoshi Okuno, Ling-Yen Yeh, Chi-Yuan Shih, Yuan Shao | 2016-05-24 |
| 9093335 | Calculating carrier concentrations in semiconductor Fins using probed resistance | Clement Hsingjen Wann, Yasutoshi Okuno, Ling-Yen Yeh, Chi-Yuan Shih, Yuan Shao | 2015-07-28 |
| 8460014 | Electronic device and pin thereof | Chang-Hsing Yeh | 2013-06-11 |