Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7253436 | Resistance defect assessment device, resistance defect assessment method, and method for manufacturing resistance defect assessment device | Michikazu Matsumoto, Yasutoshi Okuno, Tetsuya Matsutani | 2007-08-07 |