SC

Sheng-Hsiung Chen

TSMC: 114 patents #208 of 12,232Top 2%
SY Synopsys: 8 patents #127 of 2,302Top 6%
SC Synopsys Taiwan Co.: 6 patents #1 of 52Top 2%
NC National Science Council: 3 patents #63 of 867Top 8%
SU Springsoft Usa: 1 patents #19 of 58Top 35%
SP Springsoft: 1 patents #28 of 69Top 45%
AE Advanced Semiconductor Engineering: 1 patents #625 of 1,073Top 60%
Overall (All Time): #8,726 of 4,157,543Top 1%
127
Patents All Time

Issued Patents All Time

Showing 101–125 of 127 patents

Patent #TitleCo-InventorsDate
8782588 Multiple level spine routing Fong-Yuan Chang, Wei-Shun Chuang, Hsian-Ho Chang, Ruey-Shi Rau 2014-07-15
8683417 Multiple level spine routing Fong-Yuan Chang, Wei-Shun Chuang, Hsian-Ho Chang, Ruey-Shi Rau 2014-03-25
8407647 Systems and methods for designing and making integrated circuits with consideration of wiring demand ratio Fong-Yuan Chang, Tung-Chieh Chen, Ren-Song Tsay, Wai-Kei Mak 2013-03-26
7667303 Multi-chip package Jen-Te Tseng 2010-02-23
7026721 Method of improving copper pad adhesion 2006-04-11
6872627 Selective formation of metal gate for dual gate oxide application Minghsing Tsai 2005-03-29
6865948 Method of wafer edge damage inspection 2005-03-15
6818533 Epitaxial plasma enhanced chemical vapor deposition (PECVD) method providing epitaxial layer with attenuated defects Shun-Long Chen, Hungtse Lin, Ming-Shing Tsai, Lan-Chieh Shih 2004-11-16
6730580 Silicon substrate wafer fabrication method employing halogen gettering material and/or plasma annealing Shun-Long Chen, Hungtse Lin, Naite Chen 2004-05-04
6660577 Method for fabricating metal gates in deep sub-micron devices Ming-Hsing Tsai 2003-12-09
6573187 Method of forming dual damascene structure Ming-Hsing Tsai 2003-06-03
6560862 Modified pad for copper/low-k Shun-Long Chen, Hungtse Lin 2003-05-13
6518166 Liquid phase deposition of a silicon oxide layer for use as a liner on the surface of a dual damascene opening in a low dielectric constant layer Shun-Long Chen, Hungtse Lin, Frank Hsu, Tsu Shih 2003-02-11
6489684 Reduction of electromigration in dual damascene connector Tsu Shi, Ming-Hsing Tsai 2002-12-03
6466427 Microelectronic capacitor structure compatible with copper containing microelectronic conductor layer processing 2002-10-15
6420258 Selective growth of copper for advanced metallization Ming-Hsing Tsai 2002-07-16
6399486 Method of improved copper gap fill Ming-Hsing Tsai 2002-06-04
6384442 Fabrication process for metal-insulator-metal capacitor with low gate resistance 2002-05-07
6350667 Method of improving pad metal adhesion Fan Yang 2002-02-26
6313003 Fabrication process for metal-insulator-metal capacitor with low gate resistance 2001-11-06
6303459 Integration process for Al pad 2001-10-16
6303498 Method for preventing seed layer oxidation for high aspect gap fill Ming-Hsing Tsai 2001-10-16
6235637 Method for marking a wafer without inducing flat edge particle problem Ming-Hsing Tsai 2001-05-22
6191023 Method of improving copper pad adhesion 2001-02-20
5961718 Process for selectively depositing diamond films Chia-Fu Chen, Tsao-Ming Hong 1999-10-05