KP

Kuo-Reay Peng

TSMC: 25 patents #1,360 of 12,232Top 15%
Overall (All Time): #165,671 of 4,157,543Top 4%
25
Patents All Time

Issued Patents All Time

Showing 1–25 of 25 patents

Patent #TitleCo-InventorsDate
6881996 Metal-insulator-metal (MIM) capacitor structure in copper-CMOS circuits using a pad protect layer Chun-Hon Chen, Ssu-Pin Ma, Ta-Hsun Yeh, Yen-Shih Ho, Heng-Ming Hsu +2 more 2005-04-19
6876041 ESD protection component Jian-Hsing Lee, Shui-Hung Chen 2005-04-05
6812088 Method for making a new metal-insulator-metal (MIM) capacitor structure in copper-CMOS circuits using a pad protect layer Chun-Hon Chen, Ssu-Pin Ma, Ta-Hsun Yeh, Yen-Shih Ho, Heng-Ming Hsu +2 more 2004-11-02
6667217 Method of fabricating a damascene copper inductor structure using a sub-0.18 um CMOS process Heng-Ming Hsu, Jau-Yuann Chung, Yen-Shih Ho, Chun-Hon Chen, Ta-Hsun Yeh +2 more 2003-12-23
6661060 Low capacitance ESD protection device Jian-Hsing Lee, Shih-Chyi Wong 2003-12-09
6645820 Polycrystalline silicon diode string for ESD protection of different power supply connections Jian-Hsing Lee, Shui-Hung Chen 2003-11-11
6614693 Combination erase waveform to reduce oxide trapping centers generation rate of flash EEPROM Jian-Hsing Lee, Shui-Hung Chen, Jiaw-Ren Shih 2003-09-02
6610262 Depletion mode SCR for low capacitance ESD input protection Jian-Hsing Lee 2003-08-26
6472721 Dual damascene interconnect structures that include radio frequency capacitors and inductors Ssu-Pin Ma, Chun-Hon Chen, Ta-Hsun Yeh, Heng-Ming Hsu, Kong-Beng Thei +2 more 2002-10-29
6448123 Low capacitance ESD protection device Jian-Hsing Lee, Shih-Chyi Wong 2002-09-10
6329234 Copper process compatible CMOS metal-insulator-metal capacitor structure and its process flow Ssu-Pin Ma, Chun-Hon Chen, Ta-Hsun Yeh, Heng-Ming Hsu, Kong-Beng Thei +2 more 2001-12-11
6303454 Process for a snap-back flash EEPROM cell Juang-Ker Yeh, Jian-Hsing Lee, Ming-Chou Ho 2001-10-16
6122201 Clipped sine wave channel erase method to reduce oxide trapping charge generation rate of flash EEPROM Jian-Hsing Lee, Shui-Hung Chen, Jiaw-Ren Shih 2000-09-19
6055183 Erase method of flash EEPROM by using snapback characteristic Ming-Chou Ho, Jian-Hsing Lee, Juang-Ke Yeh 2000-04-25
6049484 Erase method to improve flash EEPROM endurance by combining high voltage source erase and negative gate erase Jian-Hsing Lee, Juang-Ke Yeh, Ming-Chou Ho 2000-04-11
6049486 Triple mode erase scheme for improving flash EEPROM cell threshold voltage (V.sub.T) cycling closure effect Jian-Hsing Lee 2000-04-11
6025628 High breakdown voltage twin well device with source/drain regions widely spaced from fox regions Jian-Hsing Lee, Jung-Ke Yeh, Hsiu-Han Liao 2000-02-15
5950087 Method to make self-aligned source etching available in split-gate flash Chia-Ta Hsieh, Yai-Fen Lin, Hung-Cheng Sung, Jaung-Ke Yeh, Di-Son Kuo 1999-09-07
5949717 Method to improve flash EEPROM cell write/erase threshold voltage closure Ming-Chou Ho, Juang-Ker Yeh, Jian-Hsing Lee 1999-09-07
5913122 Method of making high breakdown voltage twin well device with source/drain regions widely spaced from FOX regions Jian-Hsing Lee, Jung-Ke Yeh, Hsiu-Han Liao 1999-06-15
5903499 Method to erase a flash EEPROM using negative gate source erase followed by a high negative gate erase Jian-Hsing Lee, Juang-Ke Yeh, Ming-Chou Ho 1999-05-11
5862078 Mixed mode erase method to improve flash eeprom write/erase threshold closure Juang-Ker Yeh, Jian-Hsing Lee, Ming-Chou Ho 1999-01-19
5838618 Bi-modal erase method for eliminating cycling-induced flash EEPROM cell write/erase threshold closure Jian-Hsing Lee, Juang-Ker Yeh, Ming-Chou Ho 1998-11-17
5828605 Snapback reduces the electron and hole trapping in the tunneling oxide of flash EEPROM Jian-Hsing Lee, Juang-Ke Yeh, Ming-Chon Ho 1998-10-27
5726933 Clipped sine shaped waveform to reduce the cycling-induced electron trapping in the tunneling oxide of flash EEPROM Jian-Hsing Lee, Juang-Ke Yeh, Ming-Chou Ho 1998-03-10