Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12362180 | Method of manufacturing semiconductor devices | Chin-Ta Chen, Hua-Tai Lin, Han-Wei Wu | 2025-07-15 |
| 12196687 | Method for inspecting pattern defects | Ju-Ying CHEN, Che-Yen Lee, Chia-Fong Chang, Hua-Tai Lin, Te-Chih Huang +1 more | 2025-01-14 |
| 11961738 | Method of manufacturing semiconductor devices | Chin-Ta Chen, Hua-Tai Lin, Han-Wei Wu | 2024-04-16 |
| 8237297 | System and method for providing alignment mark for high-k metal gate process | Kuei-Shun Chen, Meng-Wei Chen, George Liu, Chia-Ching Lin | 2012-08-07 |
| 7393616 | Line end spacing measurement | Anderson Chang, Chih-Ming Ke, Heng-Jen Lee, Chin-Hsiang Lin, Tsai-Sheng Gau | 2008-07-01 |
| 5882536 | Method and etchant to join ag-clad BSSCO superconducting tape | Uthamalingam Balachandran, Anand N. Iyer | 1999-03-16 |