Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196687 | Method for inspecting pattern defects | Ju-Ying CHEN, Chia-Fong Chang, Hua-Tai Lin, Te-Chih Huang, Chi-Yuan Sun +1 more | 2025-01-14 |
| 8411142 | Intellectual surveillance system and monitoring method thereof | Wen-Chi Wang, Julian Lin | 2013-04-02 |