Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196687 | Method for inspecting pattern defects | Che-Yen Lee, Chia-Fong Chang, Hua-Tai Lin, Te-Chih Huang, Chi-Yuan Sun +1 more | 2025-01-14 |
JC
Ju-Ying CHEN
Overall (All Time): #2,379,160 of 4,157,543Top 60%
1
Patents All Time