| 11403564 |
Lithographic hotspot detection using multiple machine learning kernels |
Yen-Ting Yu, Geng-He Lin, Hui-Ru Jiang |
2022-08-02 |
$73,386,000 |
| 9594867 |
DRC-based hotspot detection considering edge tolerance and incomplete specification |
Yen-Ting Yu, Hui-Ru Jiang, Yumin Zhang |
2017-03-14 |
$16,500,000 |
| 9098649 |
Distance metric for accurate lithographic hotspot classification using radial and angular functions |
Jing Guo, Fan Yang, Subarnarekha Sinha, Xuan Zeng |
2015-08-04 |
$12,754,000 |
| 8635580 |
Preconditioning for EDA cell library |
Xin Wang |
2014-01-21 |
$6,821,000 |
| 8601419 |
Accurate process hotspot detection using critical design rule extraction |
Yen-Ting Yu, Hui-Ru Jiang, Subarnarekha Sinha, Ya-Chung Chan |
2013-12-03 |
$4,231,000 |
| 8490030 |
Distance metric for accurate lithographic hotspot classification using radial and angular functions |
Jing Guo, Fan Yang, Subarnarekha Sinha, Xuan Zeng |
2013-07-16 |
$6,727,000 |
| 8452075 |
Range pattern matching for hotspots containing vias and incompletely specified range patterns |
Jingyu Xu, Subarnarekha Sinha |
2013-05-28 |
$4,195,000 |
| 8286121 |
Preconditioning for EDA cell library |
Xin Wang |
2012-10-09 |
$4,365,000 |
| 8219941 |
Range pattern definition of susceptibility of layout regions to fabrication issues |
Subarnarekha Sinha |
2012-07-10 |
$3,650,000 |
| 8209639 |
Identifying layout regions susceptible to fabrication issues by using range patterns |
Subarnarekha Sinha, Hailong Yao |
2012-06-26 |
$5,356,000 |
| 8205179 |
Fast evaluation of average critical area for IC layouts |
Qing Su, Subarnarekha Sinha |
2012-06-19 |
$3,229,000 |
| 8205185 |
Fast evaluation of average critical area for IC layouts |
Qing Su, Subarnarekha Sinha |
2012-06-19 |
$3,229,000 |
| 8176456 |
Method and apparatus for computing dummy feature density for chemical-mechanical polishing |
Xin Wang, Jamil Kawa |
2012-05-08 |
$7,909,000 |
| 8151236 |
Steiner tree based approach for polygon fracturing |
Qing Su, Yongqiang Lu |
2012-04-03 |
$5,527,000 |
| 8146032 |
Method and apparatus for performing RLC modeling and extraction for three-dimensional integrated circuit (3D-IC) designs |
Qiushi CHEN, Beifang Qiu, Xiaoping Hu, Mathew Koshy, Baribrata Biswas |
2012-03-27 |
$6,043,000 |
| 8141007 |
Method and apparatus for identifying and correcting phase conflicts |
Subarnarekha Sinha |
2012-03-20 |
$5,494,000 |
| 8006212 |
Method and system for facilitating floorplanning for 3D IC |
Subarnarekha Sinha |
2011-08-23 |
$2,981,000 |
| 8000826 |
Predicting IC manufacturing yield by considering both systematic and random intra-die process variations |
Jianfeng Luo, Subarnarekha Sinha, Qing Su |
2011-08-16 |
$2,617,000 |
| 7962873 |
Fast evaluation of average critical area for ic layouts |
Qing Su, Subarnarekha Sinha |
2011-06-14 |
$2,204,000 |
| 7962882 |
Fast evaluation of average critical area for IC layouts |
Qing Su, Subarnarekha Sinha |
2011-06-14 |
$2,204,000 |
| 7823099 |
Lithography suspect spot location and scoring system |
Min-Chun Tsai |
2010-10-26 |
$7,257,000 |
| 7707526 |
Predicting IC manufacturing yield based on hotspots |
Qing Su |
2010-04-27 |
$5,390,000 |
| 7703067 |
Range pattern definition of susceptibility of layout regions to fabrication issues |
Subarnarekha Sinha |
2010-04-20 |
$7,829,000 |
| 7644378 |
Preconditioning for EDA cell library |
Xin Wang |
2010-01-05 |
$17,111,000 |
| 7594213 |
Method and apparatus for computing dummy feature density for chemical-mechanical polishing |
Xin Wang, Jamil Kawa |
2009-09-22 |
$13,303,000 |