Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9098649 | Distance metric for accurate lithographic hotspot classification using radial and angular functions | Charles C. Chiang, Jing Guo, Fan Yang, Xuan Zeng | 2015-08-04 |
| 8601419 | Accurate process hotspot detection using critical design rule extraction | Charles C. Chiang, Yen-Ting Yu, Hui-Ru Jiang, Ya-Chung Chan | 2013-12-03 |
| 8578313 | Pattern-clip-based hotspot database system for layout verification | Zongwu Tang, Daniel Zhang, Alex Miloslavsky, Jingyu Xu, Kent Y. Kwang +1 more | 2013-11-05 |
| 8566754 | Dual-purpose perturbation engine for automatically processing pattern-clip-based manufacturing hotspots | Kent Y. Kwang, Daniel Zhang, Zongwu Tang | 2013-10-22 |
| 8490030 | Distance metric for accurate lithographic hotspot classification using radial and angular functions | Charles C. Chiang, Jing Guo, Fan Yang, Xuan Zeng | 2013-07-16 |
| 8452075 | Range pattern matching for hotspots containing vias and incompletely specified range patterns | Jingyu Xu, Charles C. Chiang | 2013-05-28 |
| 8219941 | Range pattern definition of susceptibility of layout regions to fabrication issues | Charles C. Chiang | 2012-07-10 |
| 8209639 | Identifying layout regions susceptible to fabrication issues by using range patterns | Hailong Yao, Charles C. Chiang | 2012-06-26 |
| 8205179 | Fast evaluation of average critical area for IC layouts | Qing Su, Charles C. Chiang | 2012-06-19 |
| 8205185 | Fast evaluation of average critical area for IC layouts | Qing Su, Charles C. Chiang | 2012-06-19 |
| 8141007 | Method and apparatus for identifying and correcting phase conflicts | Charles C. Chiang | 2012-03-20 |
| 8006212 | Method and system for facilitating floorplanning for 3D IC | Charles C. Chiang | 2011-08-23 |
| 8000826 | Predicting IC manufacturing yield by considering both systematic and random intra-die process variations | Jianfeng Luo, Qing Su, Charles C. Chiang | 2011-08-16 |
| 7962873 | Fast evaluation of average critical area for ic layouts | Qing Su, Charles C. Chiang | 2011-06-14 |
| 7962882 | Fast evaluation of average critical area for IC layouts | Qing Su, Charles C. Chiang | 2011-06-14 |
| 7703067 | Range pattern definition of susceptibility of layout regions to fabrication issues | Charles C. Chiang | 2010-04-20 |
| 7679872 | Electrostatic-discharge protection using a micro-electromechanical-system switch | Jamil Kawa, Min-Chun Tsai, Zongwu Tang, Qing Su | 2010-03-16 |
| 7543255 | Method and apparatus to reduce random yield loss | Qing Su, Charles C. Chiang | 2009-06-02 |
| 7509622 | Dummy filling technique for improved planarization of chip surface topography | Jianfeng Luo, Charles C. Chiang | 2009-03-24 |
| 7503029 | Identifying layout regions susceptible to fabrication issues by using range patterns | Hailong Yao, Charles C. Chiang | 2009-03-10 |
| 7496883 | Method and apparatus for identifying and correcting phase conflicts | Charles C. Chiang | 2009-02-24 |
| 7346865 | Fast evaluation of average critical area for IC layouts | Qing Su, Charles C. Chiang | 2008-03-18 |