Issued Patents All Time
Showing 51–75 of 86 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7166018 | Apparatus and method for feeding slurry | Akihiro Tanoue, Yoshiharu Hidaka | 2007-01-23 |
| 7078204 | Glucose-6-phosphate dehydrogenase | Haruhiko Yokoi, Seiko Ando, Keiko Ochiai, Yoshiyuki Yonetani | 2006-07-18 |
| 7052377 | Apparatus and method for feeding slurry | Akihiro Tanoue, Yoshiharu Hidaka | 2006-05-30 |
| 7049111 | Process for producing HMG-CoA reductase inhibitor | Hirofumi Endo, Yoshiyuki Yonetani, Hiroshi Mizoguchi, Akio Ozaki | 2006-05-23 |
| 7037371 | Method for fabricating semiconductor device | Takenobu Kishida, Kyoko Egashira, Yoshifumi Hata, Toru Nishiwaki, Tomoya Tanaka | 2006-05-02 |
| 6995415 | Semiconductor device and its manufacturing method | Hisashi Ogawa, Hiroaki Nakaoka, Atsuhiro Kajiya, Kyoko Egashira | 2006-02-07 |
| 6946270 | Process for producing HMG-CoA reductase inhibitors | Yoshiyuki Yonetani, Akio Ozaki | 2005-09-20 |
| 6919574 | Electron beam exposure apparatus, deflection apparatus, and electron beam exposure method | Haruo Yoda, Masato Muraki | 2005-07-19 |
| 6917045 | Electron beam exposure apparatus, electron beam exposure apparatus calibration method, and semiconductor element manufacturing method | Haruo Yoda, Masato Muraki | 2005-07-12 |
| 6790127 | Apparatus and method for feeding slurry | Akihiro Tanoue, Yoshiharu Hidaka | 2004-09-14 |
| 6784442 | Exposure apparatus, control method thereof, and device manufacturing method | Masato Muraki, Hiroya Ohta | 2004-08-31 |
| 6774379 | Electron beam exposure apparatus and deflection amount correction method | — | 2004-08-10 |
| 6585560 | Apparatus and method for feeding slurry | Akihiro Tanoue, Yoshiharu Hidaka | 2003-07-01 |
| 6562716 | Method for fabricating semiconductor device | Kyoko Egashira | 2003-05-13 |
| 6428398 | Method for wafer polishing and method for polishing-pad dressing | Yoshiharu Hidaka | 2002-08-06 |
| 6365381 | Method for producing optically active compound | Ryoichi Katsumata | 2002-04-02 |
| 6323663 | Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method | Yoshirou Nakata, Toshio Yamada, Atsushi Fujiwara, Isao Miyanaga, Yukiharu Uraoka +2 more | 2001-11-27 |
| 6319099 | Apparatus and method for feeding slurry | Akihiro Tanoue, Yoshiharu Hidaka | 2001-11-20 |
| 6308316 | Apparatus for analyzing operations of parallel processing system | Reiji Masaki | 2001-10-23 |
| 6291350 | Method of polishing semiconductor wafer | Yuichi Miyoshi | 2001-09-18 |
| 6207427 | Method for producing optically active compound | Ryoichi Katsumata | 2001-03-27 |
| 6180423 | Method for wafer polishing and method for polishing pad dressing | Yoshiharu Hidaka | 2001-01-30 |
| 6005401 | Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method | Yoshirou Nakata, Toshio Yamada, Atsushi Fujiwara, Isao Miyanaga, Yukiharu Uraoka +2 more | 1999-12-21 |
| 5945834 | Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method | Yoshirou Nakata, Toshio Yamada, Atsushi Fujiwara, Isao Miyanaga, Yukiharu Uraoka +2 more | 1999-08-31 |
| 5892368 | Semiconductor integrated circuit device having failure detection circuitry | Yoshiro Nakata, Isao Miyanaga | 1999-04-06 |