Issued Patents All Time
Showing 1–25 of 49 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8324706 | Semiconductor device and a method of manufacturing the same | Kazuhisa Higuchi, Takayuki Nakaji, Masami Koketsu, Hideki Yasuoka | 2012-12-04 |
| 8006402 | Shape measuring apparatus and shape measuring method | Masateru Doi, Takayuki Kurata | 2011-08-30 |
| 7797851 | Shape measurement device probe and shape measurement device | Takanori Funabashi | 2010-09-21 |
| 7759763 | Semiconductor device and a method of manufacturing the same | Kazuhisa Higuchi, Takayuki Nakaji, Masami Koketsu, Hideki Yasuoka | 2010-07-20 |
| 7592669 | Semiconductor device with MISFET that includes embedded insulating film arranged between source/drain regions and channel | Hideki Yasuoka, Masami Koketsu | 2009-09-22 |
| 7520067 | Three-dimensional measurement probe | Keishi Kubo, Hiroyuki Mochizuki, Takanori Funabashi | 2009-04-21 |
| 7514749 | Semiconductor device and a method of manufacturing the same | Kunihiko Kato, Masami Koketsu, Shigeya Toyokawa, Hideki Yasuoka, Yasuhiro Takeda | 2009-04-07 |
| 7393737 | Semiconductor device and a method of manufacturing the same | Kazuhisa Higuchi, Takayuki Nakaji, Masami Koketsu, Hideki Yasuoka | 2008-07-01 |
| 7391083 | Semiconductor device and a method of manufacturing the same | Kunihiko Kato, Masami Koketsu, Shigeya Toyokawa, Hideki Yasuoka, Yasuhiro Takeda | 2008-06-24 |
| 7259054 | Method of manufacturing a semiconductor device that includes a process for forming a high breakdown voltage field effect transistor | Hideki Yasuoka, Masami Koketsu | 2007-08-21 |
| 7065893 | Measurement probe and using method for the same | Takaaki Kassai, Keishi Kubo, Masateru Doi, Hiroyuki Mochizuki | 2006-06-27 |
| 7029224 | Method and apparatus for transferring a thin plate | Keishi Kubo, Hiroyuki Takeuchi, Koji Handa, Takaaki Kassai | 2006-04-18 |
| 7012680 | Method and apparatus for quantitative quality inspection of substrate such as wafer | Keishi Kubo, Masateru Doi, Hiroyuki Motizuki | 2006-03-14 |
| 6995058 | Semiconductor memory device and manufacturing method thereof | Kazufumi Suenaga, Kiyoshi Ogata, Kazuhiko Horikoshi, Jun Tanaka, Hisayuki Kato +1 more | 2006-02-07 |
| 6934036 | Configuration measuring apparatus and method | Keishi Kubo, Yukio Imada, Hiroyuki Takeuchi, Kouji Handa | 2005-08-23 |
| 6906365 | Ferroelectric memory device including an upper protection electrode | Kiyoshi Ogata, Kazuhiko Horikoshi, Kazufumi Suenaga, Hisayuki Kato, Masahito Yamazaki | 2005-06-14 |
| 6770492 | Ferroelectric memory device | Hiromichi Waki, Mitsuhiro Mori | 2004-08-03 |
| 6763319 | Profilometer and method for measuring, and method for manufacturing object of surface profiling | Koji Handa, Keishi Kubo, Hiroyuki Takeuchi | 2004-07-13 |
| 6710883 | Apparatus and method for measuring flatness of thin plate | Keishi Kubo, Hiroyuki Takeuchi, Kouji Handa | 2004-03-23 |
| 6623986 | Method of manufacturing a ferroelectric memory device | Kiyoshi Ogata, Kazuhiko Horikoshi, Kazufumi Suenaga, Hisayuki Kato, Masahito Yamazaki | 2003-09-23 |
| 6579754 | Semiconductor memory device having ferroelectric film and manufacturing method thereof | Kazufumi Suenaga, Kiyoshi Ogata, Kazuhiko Horikoshi, Jun Tanaka, Hisayuki Kato +1 more | 2003-06-17 |
| 6509597 | Ferroelectric memory device | Hiromichi Waki, Mitsuhiro Mori | 2003-01-21 |
| 6480286 | Method and apparatus for measuring thickness variation of a thin sheet material, and probe reflector used in the apparatus | Keishi Kubo, Yukio Imada, Hiroyuki Takeuchi, Koji Handa | 2002-11-12 |
| 6445025 | Semiconductor memory device and manufacturing method thereof | Kazufumi Suenaga, Kiyoshi Ogata, Kazuhiko Horikoshi, Jun Tanaka, Hisayuki Kato +1 more | 2002-09-03 |
| 6326216 | Process for producing semiconductor integrated circuit device | Hisayuki Kato, Hisahiko Abe, Shinji Nishihara, Masahito Yamazaki | 2001-12-04 |