Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7029224 | Method and apparatus for transferring a thin plate | Keishi Kubo, Keiichi Yoshizumi, Hiroyuki Takeuchi, Takaaki Kassai | 2006-04-18 |
| 6763319 | Profilometer and method for measuring, and method for manufacturing object of surface profiling | Keiichi Yoshizumi, Keishi Kubo, Hiroyuki Takeuchi | 2004-07-13 |
| 6480286 | Method and apparatus for measuring thickness variation of a thin sheet material, and probe reflector used in the apparatus | Keishi Kubo, Keiichi Yoshizumi, Yukio Imada, Hiroyuki Takeuchi | 2002-11-12 |
| 6026583 | Shape measuring apparatus and method | Keiichi Yoshizumi, Hiroyuki Takeuchi, Keishi Kubo, Yukio Imada | 2000-02-22 |
| 5616916 | Configuration measuring method and apparatus for optically detecting a displacement of a probe due to an atomic force | Keishi Kubo, Masateru Doi, Keiichi Yoshizumi | 1997-04-01 |
| 4810095 | Laser-beam, pattern drawing/inspecting apparatus | Yasunobu Kawauchi | 1989-03-07 |