Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11473904 | Measurement probe | Keishi Kubo, Takashi Inoue, Makoto Okazaki, Yukiya Usui, Takanori Funabashi | 2022-10-18 |
| 8006402 | Shape measuring apparatus and shape measuring method | Keiichi Yoshizumi, Takayuki Kurata | 2011-08-30 |
| 7178393 | Measuring apparatus and method for thin board | Keishi Kubo, Naofumi Hino, Hiroyuki Mochizuki, Syojiro Satake | 2007-02-20 |
| 7065893 | Measurement probe and using method for the same | Takaaki Kassai, Keishi Kubo, Hiroyuki Mochizuki, Keiichi Yoshizumi | 2006-06-27 |
| 7012680 | Method and apparatus for quantitative quality inspection of substrate such as wafer | Keishi Kubo, Hiroyuki Motizuki, Keiichi Yoshizumi | 2006-03-14 |
| 5616916 | Configuration measuring method and apparatus for optically detecting a displacement of a probe due to an atomic force | Koji Handa, Keishi Kubo, Keiichi Yoshizumi | 1997-04-01 |