Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7012680 | Method and apparatus for quantitative quality inspection of substrate such as wafer | Keishi Kubo, Masateru Doi, Keiichi Yoshizumi | 2006-03-14 |
HM
Hiroyuki Motizuki
Overall (All Time): #3,410,395 of 4,157,543Top 85%
1
Patents All Time