KK

Keishi Kubo

Ricoh Company: 35 patents #475 of 9,818Top 5%
Sumitomo Electric Industries: 19 patents #1,151 of 21,551Top 6%
PA Panasonic: 4 patents #6,180 of 21,108Top 30%
UM University Of Miyazaki: 1 patents #34 of 87Top 40%
📍 Numazu, JP: #13 of 856 inventorsTop 2%
Overall (All Time): #39,278 of 4,157,543Top 1%
60
Patents All Time

Issued Patents All Time

Showing 1–25 of 60 patents

Patent #TitleCo-InventorsDate
11473904 Measurement probe Takashi Inoue, Masateru Doi, Makoto Okazaki, Yukiya Usui, Takanori Funabashi 2022-10-18
11414474 Long-acting adrenomedullin derivatives Kazuo Kitamura, Johji Kato, Kenji Kuwasako, Shigeru Kubo, Kumiko Kumagaye 2022-08-16
9080846 Shape measuring apparatus 2015-07-14
7520067 Three-dimensional measurement probe Keiichi Yoshizumi, Hiroyuki Mochizuki, Takanori Funabashi 2009-04-21
7178393 Measuring apparatus and method for thin board Masateru Doi, Naofumi Hino, Hiroyuki Mochizuki, Syojiro Satake 2007-02-20
7065893 Measurement probe and using method for the same Takaaki Kassai, Masateru Doi, Hiroyuki Mochizuki, Keiichi Yoshizumi 2006-06-27
7029224 Method and apparatus for transferring a thin plate Keiichi Yoshizumi, Hiroyuki Takeuchi, Koji Handa, Takaaki Kassai 2006-04-18
7012680 Method and apparatus for quantitative quality inspection of substrate such as wafer Masateru Doi, Hiroyuki Motizuki, Keiichi Yoshizumi 2006-03-14
6934036 Configuration measuring apparatus and method Yukio Imada, Hiroyuki Takeuchi, Kouji Handa, Keiichi Yoshizumi 2005-08-23
6763319 Profilometer and method for measuring, and method for manufacturing object of surface profiling Koji Handa, Keiichi Yoshizumi, Hiroyuki Takeuchi 2004-07-13
6710883 Apparatus and method for measuring flatness of thin plate Keiichi Yoshizumi, Hiroyuki Takeuchi, Kouji Handa 2004-03-23
6656879 Method of reversible selective manifestation of different states of functional element Kyoji Tsutsui, Takehito Yamaguchi, Hideaki Ema, Masaru Shimada, Hiroshi Goto +5 more 2003-12-02
6480286 Method and apparatus for measuring thickness variation of a thin sheet material, and probe reflector used in the apparatus Keiichi Yoshizumi, Yukio Imada, Hiroyuki Takeuchi, Koji Handa 2002-11-12
RE37034 Reversible thermosensitive recording material Yoshihiko Hotta 2001-01-30
6026583 Shape measuring apparatus and method Keiichi Yoshizumi, Hiroyuki Takeuchi, Yukio Imada, Koji Handa 2000-02-22
5917181 Profile measuring apparatus Keiichi Yoshizumi, Shoji Kusumoto, Kiyokazu Uchimura, Keinosuke Kanashima 1999-06-29
5700746 Reversible thermosensitive recording medium Atsushi Kutami, Eiichi Kawamura 1997-12-23
RE35640 Reversible thermosensitive recording material Yoshihiko Hotta, Makoto Kawaguchi, Toru Nogiwa 1997-10-21
5616916 Configuration measuring method and apparatus for optically detecting a displacement of a probe due to an atomic force Koji Handa, Masateru Doi, Keiichi Yoshizumi 1997-04-01
5521371 Rewritable bar code display medium, and image display method and image display apparatus using the same Yoshihiko Hotta, Shoji Maruyama, Takashi Yano, Hajime Takayama 1996-05-28
5521138 Reversible thermosensitive coloring composition, and recording medium using the same Masaru Shimada, Hiroshi Goto, Eiichi Kawamura, Shoji Maruyama, Kyoji Tsutsui 1996-05-28
5459939 Apparatus and method for measuring width of micro gap Keiichi Yoshizumi 1995-10-24
5455677 Optical probe Keiichi Yoshizumi 1995-10-03
5432534 Reversible thermosensitive coloring composition, recording medium, recording method, and image display apparatus using the recording medium Shoji Maruyama, Hiroshi Goto, Eiichi Kawamura, Masaru Shimada, Kyoji Tsutsui +5 more 1995-07-11
5395433 Reversible thermosensitive coloring composition, recording medium, recording method, and image display apparatus using the recording medium Shoji Maruyama, Hiroshi Goto, Eiichi Kawamura, Masaru Shimada, Kyoji Tsutsui +5 more 1995-03-07