Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6934036 | Configuration measuring apparatus and method | Keishi Kubo, Yukio Imada, Hiroyuki Takeuchi, Keiichi Yoshizumi | 2005-08-23 |
| 6710883 | Apparatus and method for measuring flatness of thin plate | Keiichi Yoshizumi, Keishi Kubo, Hiroyuki Takeuchi | 2004-03-23 |