Issued Patents All Time
Showing 26–49 of 49 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6316798 | Ferroelectric memory device and method for manufacturing the same | Kiyoshi Ogata, Kazuhiko Horikoshi, Kazufumi Suenaga, Hisayuki Kato, Masahito Yamazaki | 2001-11-13 |
| 6239457 | Semiconductor memory device and manufacturing method thereof | Kazufumi Suenaga, Kiyoshi Ogata, Kazuhiko Horikoshi, Jun Tanaka, Hisayuki Kato +1 more | 2001-05-29 |
| 6026583 | Shape measuring apparatus and method | Hiroyuki Takeuchi, Keishi Kubo, Yukio Imada, Koji Handa | 2000-02-22 |
| 5917181 | Profile measuring apparatus | Keishi Kubo, Shoji Kusumoto, Kiyokazu Uchimura, Keinosuke Kanashima | 1999-06-29 |
| 5880497 | Semiconductor integrated circuit device having capacitance element and process of manufacturing the same | Shuji Ikeda, Koichi Imato, Kazuo Yoshizaki, Kohji Yamasaki, Soichiro Hashiba +12 more | 1999-03-09 |
| 5780328 | Process for producing semiconductor integrated circuit | Kazushi Fukuda, Yasuko Yoshida, Yutaka Hoshino, Naotaka Hashimoto, Kyoichiro Asayama +4 more | 1998-07-14 |
| 5616916 | Configuration measuring method and apparatus for optically detecting a displacement of a probe due to an atomic force | Koji Handa, Keishi Kubo, Masateru Doi | 1997-04-01 |
| 5610856 | Semiconductor integrated circuit device | Satoru Haga, Shuji Ikeda, Kiichi Makuta, Takeshi Fukazawa | 1997-03-11 |
| 5508540 | Semiconductor integrated circuit device and process of manufacturing the same | Shuji Ikeda, Koichi Imato, Kazuo Yoshizaki, Kohji Yamasaki, Soichiro Hashiba +12 more | 1996-04-16 |
| 5459939 | Apparatus and method for measuring width of micro gap | Keishi Kubo | 1995-10-24 |
| 5455677 | Optical probe | Keishi Kubo | 1995-10-03 |
| 5444012 | Method for manufacturing semiconductor integrated circuit device having a fuse element | Kazushi Fukuda, Seiichi Ariga, Shuji Ikeda, Makoto Saeki, Kiyoshi Nagai +3 more | 1995-08-22 |
| 5371023 | Gate circuit, semiconductor integrated circuit device and method of fabrication thereof, semiconductor memory and microprocessor | Masataka Minami, Mitsuru Hiraki, Kazuo Yano, Atsuo Watanabe, Kouichi Seki +3 more | 1994-12-06 |
| 5328864 | Method of doping gate electrodes discretely with either P-type or N-type impurities to form discrete semiconductor regions | Satoshi Kudo | 1994-07-12 |
| 5319194 | Apparatus for measuring birefringence without employing rotating mechanism | Keishi Kubo | 1994-06-07 |
| 5315374 | Three-dimensional measuring apparatus | — | 1994-05-24 |
| 5283630 | Error correcting method for measuring object surface using three-dimension measuring apparatus | — | 1994-02-01 |
| 5144150 | Configuration measuring apparatus | Keishi Kubo | 1992-09-01 |
| 5032537 | Method of doping gate electrodes discretely with either P-type or N-type impurities to form discrete semiconductor regions | Satoshi Kudo | 1991-07-16 |
| 4822139 | Optical head apparatus for optical disc player | — | 1989-04-18 |
| 4776699 | Optical measuring device | — | 1988-10-11 |
| 4766303 | Optical information system having a birefringence plate movably disposed in accordance with the detected light intensity | Akira Matsubara, Takao Hayashi | 1988-08-23 |
| 4611916 | Optical measuring apparatus | — | 1986-09-16 |
| 4507766 | Optical device for optically recording and reproducing information signals on an information carrier | Tetsuo Saimi | 1985-03-26 |