PW

Peter Weigand

SA Siemens Aktiengesellschaft: 11 patents #902 of 22,248Top 5%
KT Kabushiki Kaisha Toshiba: 4 patents #6,684 of 21,451Top 35%
IBM: 2 patents #32,839 of 70,183Top 50%
MC Ml Netherlands C.V.: 2 patents #4 of 8Top 50%
Infineon Technologies Ag: 1 patents #168 of 446Top 40%
ML Magic Leap: 1 patents #578 of 665Top 90%
SM Siemens Microelectronics: 1 patents #5 of 40Top 15%
AG Air Liquide Global E&C Solutions Germany Gmbh: 1 patents #14 of 48Top 30%
Overall (All Time): #205,266 of 4,157,543Top 5%
21
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11563926 User feedback for real-time checking and improving quality of scanned image Alexander Ilic, Erik Fonseka 2023-01-24
10841551 User feedback for real-time checking and improving quality of scanned image Alexander Ilic, Erik Fonseka 2020-11-17
10298898 User feedback for real-time checking and improving quality of scanned image Alexander Ilic, Erik Fonseka 2019-05-21
9758291 Port arrangement for an internal component Gunter Quass, Jens von Waaden 2017-09-12
6492282 Integrated circuits and manufacturing methods Dirk Tobben, Matthias Ilg 2002-12-10
6406545 Semiconductor workpiece processing apparatus and method Naohiro Shoda 2002-06-18
6252292 Vertical electrical cavity-fuse Axel Brintzinger, Roy Iggulden, Stefan Weber 2001-06-26
6150072 Method of manufacturing a shallow trench isolation structure for a semiconductor device Naohiro Shoda 2000-11-21
6136709 Metal line deposition process Sven Schmidbauer, Stefan Weber, Larry Clevenger, Roy Iggulden 2000-10-24
6046503 Metalization system having an enhanced thermal conductivity Dirk Tobben 2000-04-04
6015988 Microstructure and methods for fabricating such structure Dirk Tobben 2000-01-18
5992046 Semiconductor wafer temperature measurement and control thereof using gas temperature measurement Naohiro Shoda 1999-11-30
5977635 Multi-level conductive structure including low capacitance material Dirk Tobben 1999-11-02
5963837 Method of planarizing the semiconductor structure Matthias Ilg, Dirk Tobben 1999-10-05
5937541 Semiconductor wafer temperature measurement and control thereof using gas temperature measurement Naohiro Shoda 1999-08-17
5926716 Method for forming a structure Dirk Tobben 1999-07-20
5899736 Techniques for forming electrically blowable fuses on an integrated circuit Dirk Tobben 1999-05-04
5854126 Method for forming metallization in semiconductor devices with a self-planarizing material Dirk Tobben, Bruno Spuler, Martin Gutsche 1998-12-29
5851899 Gapfill and planarization process for shallow trench isolation 1998-12-22
5415256 Friction type torque-limiting clutch brake which splits into halves for easy replacement William Arlendo Smith, Thomas A. Kay, Jr., Hugh R. Harris 1995-05-16
4952108 Apparatus for automatically feeding a sequence of crucibles to a test oven Harald Langen, Hans Joachim KUPKA, Gerhard Rossel, Walter Weigand, Rudiger Wittenbeck +1 more 1990-08-28