KS

Kiyokazu Shishido

ST Sandisk Technologies: 15 patents #200 of 2,224Top 9%
📍 Yokkaichi, JP: #259 of 2,072 inventorsTop 15%
Overall (All Time): #310,321 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
12426354 Field effect transistors with reduced gate fringe area and method of making the same Takahito Fujita, Hiroyuki Ogawa 2025-09-23
12032837 Non-volatile memory with reduced word line switch area Yuki Mizutani, Kazutaka Yoshizawa, Eiichi Fujikura 2024-07-09
11876096 Field effect transistors with reduced gate fringe area and method of making the same Takahito Fujita, Hiroyuki Ogawa 2024-01-16
11710740 Field effect transistors with reduced gate fringe area and method of making the same Takahito Fujita, Hiroyuki Ogawa 2023-07-25
11069707 Variable die size memory device and methods of manufacturing the same Tomoka Tanabe, Hiroyuki Ogawa, Takahito Fujita 2021-07-20
10804284 Three-dimensional memory device containing bidirectional taper staircases and methods of making the same Yasushi Ishii, Jun Akaiwa, Hiroyuki Ogawa 2020-10-13
10770459 CMOS devices containing asymmetric contact via structures Dai Iwata, Yasushi Ishii, Hiroshi Nakatsuji, Hiroyuki Ogawa 2020-09-08
10515907 Three-dimensional memory device containing hydrogen diffusion blocking structures and method of making the same Takahito Fujita, Hiroyuki Ogawa 2019-12-24
10515897 Three-dimensional memory device containing hydrogen diffusion blocking structures and method of making the same Masatoshi Nishikawa, Akio Nishida, Murshed Chowdhury, Takahito Fujita, Hiroyuki Ogawa 2019-12-24
10355017 CMOS devices containing asymmetric contact via structures and method of making the same Hiroshi Nakatsuji, Hiroyuki Ogawa 2019-07-16
10256099 Transistors having semiconductor-metal composite gate electrodes containing different thickness interfacial dielectrics and methods of making thereof Jun Akaiwa, Hiroyuki Ogawa 2019-04-09
9607997 Metal line with increased inter-metal breakdown voltage Katsuo Yamada, Yuji Takahashi, Noritaka Fukuo, Masami Uozaki, Takuya Futase +1 more 2017-03-28
9524904 Early bit line air gap formation Hiroto Ohori, Takuya Futase, Yuji Takahashi, Toshiyuki Sega, Kotaro Jinnouchi +1 more 2016-12-20
9478461 Conductive line structure with openings Takuya Futase, Hiroto Ohori, Kotaro Jinnouchi, Noritaka Fukuo, Yuji Takahashi +1 more 2016-10-25
9391081 Metal indentation to increase inter-metal breakdown voltage Takuya Futase, Noritaka Fukuo, Yuji Takahashi, Shunsuke Watanabe, Katsuo Yamada +1 more 2016-07-12