Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10886366 | Semiconductor structures for peripheral circuitry having hydrogen diffusion barriers and method of making the same | — | 2021-01-05 |
| 10734400 | Three-dimensional memory device including bit lines between memory elements and an underlying peripheral circuit and methods of making the same | Masayuki Hiroi | 2020-08-04 |
| 10256167 | Hydrogen diffusion barrier structures for CMOS devices and method of making the same | Hokuto KODATE, Eiichi Fujikura, Akinori Yutani, Kengo Miura, Masaomi Koizumi +1 more | 2019-04-09 |
| 9847249 | Buried etch stop layer for damascene bit line formation | Yuji Takahashi, Takuya Futase, Katsuo Yamada, Tomoyasu Kakegawa | 2017-12-19 |
| 9799527 | Double trench isolation | Katsuo Yamada, Yuji Takahashi, Takuya Futase, Tomoyasu Kakegawa | 2017-10-24 |
| 9768183 | Source line formation and structure | Shunsuke Akimoto, Hidetoshi Nakamoto, Keita Kumamoto, Hidehito Koseki, Yuji Takahashi +2 more | 2017-09-19 |
| 9666479 | Patterning method for low-k inter-metal dielectrics and associated semiconductor device | — | 2017-05-30 |
| 9607997 | Metal line with increased inter-metal breakdown voltage | Katsuo Yamada, Yuji Takahashi, Masami Uozaki, Kiyokazu Shishido, Takuya Futase +1 more | 2017-03-28 |
| 9524904 | Early bit line air gap formation | Hiroto Ohori, Takuya Futase, Yuji Takahashi, Toshiyuki Sega, Kiyokazu Shishido +1 more | 2016-12-20 |
| 9478461 | Conductive line structure with openings | Kiyokazu Shishido, Takuya Futase, Hiroto Ohori, Kotaro Jinnouchi, Yuji Takahashi +1 more | 2016-10-25 |
| 9401304 | Patterning method for low-k inter-metal dielectrics and associated semiconductor device | — | 2016-07-26 |
| 9391606 | Semiconductor integrated circuit device | Hideki Aono, Eiichi Murakami | 2016-07-12 |
| 9391081 | Metal indentation to increase inter-metal breakdown voltage | Kiyokazu Shishido, Takuya Futase, Yuji Takahashi, Shunsuke Watanabe, Katsuo Yamada +1 more | 2016-07-12 |
| 9177853 | Barrier layer stack for bit line air gap formation | Takuya Futase, Katsuo Yamada, Tomoyasu Kakegawa, Yuji Takahashi | 2015-11-03 |