SK

Sang-Yong Kim

Samsung: 29 patents #4,224 of 75,807Top 6%
KT Korea Institute Of Industrial Technology: 9 patents #12 of 668Top 2%
BC Bolak Co.: 7 patents #1 of 15Top 7%
AT Amkor Technology: 3 patents #206 of 595Top 35%
AS Anam Semiconductor: 2 patents #9 of 53Top 20%
LC Lg Semicon Co.: 1 patents #258 of 547Top 50%
SH Sk Hynix: 1 patents #3,115 of 4,849Top 65%
LG: 1 patents #17,402 of 26,165Top 70%
HE Hynix (Hyundai Electronics): 1 patents #731 of 1,604Top 50%
AS Asemiconductor: 1 patents #3 of 8Top 40%
DS Dongbuanam Semiconductor: 1 patents #25 of 76Top 35%
AL Alticast: 1 patents #12 of 44Top 30%
KT Koh Young Technology: 1 patents #89 of 142Top 65%
Overall (All Time): #41,611 of 4,157,543Top 2%
58
Patents All Time

Issued Patents All Time

Showing 26–50 of 58 patents

Patent #TitleCo-InventorsDate
8637942 Transistor having a metal nitride layer pattern, etchant and methods of forming the same Ji-Hoon Cha, Woo-Gwan Shim, Chang-Ki Hong, Sang-jun Choi 2014-01-28
7879735 Cleaning solution for silicon surface and methods of fabricating semiconductor device using the same Chang-Ki Hong, Woo-Gwan Shim 2011-02-01
7804084 Phase change memory elements having a confined portion of phase change material on a recessed contact Joon-Sang Park, Chang-Ki Hong 2010-09-28
7700496 Transistor having a metal nitride layer pattern, etchant and methods of forming the same Ji-Hoon Cha, Woo-Gwan Shim, Chang-Ki Hong, Sang-jun Choi 2010-04-20
7562662 Cleaning solution and cleaning method of a semiconductor device Sang-jun Choi, Chang-Ki Hong 2009-07-21
7449417 Cleaning solution for silicon surface and methods of fabricating semiconductor device using the same Chang-Ki Hong, Woo-Gwan Shim 2008-11-11
7435644 Method of manufacturing capacitor of semiconductor device Woo-Gwan Shim, Jung-Min Oh, Chang-Ki Hong, Sang-jun Choi 2008-10-14
7390719 Method of manufacturing a semiconductor device having a dual gate structure Taek-Soo Jeon, Yu-Gyun Shin, Sang-Bom Kang, Hag-Ju Cho, Hye-Lan Lee 2008-06-24
7384825 Methods of fabricating phase change memory elements having a confined portion of phase change material on a recessed contact Joon-Sang Park, Chang-Ki Hong 2008-06-10
7322385 Apparatus for drying substrate and method thereof Chang-Ki Hong, Sang-jun Choi, Woo-Gwan Shim 2008-01-29
7265040 Cleaning solution and method for selectively removing layer in a silicidation process Kun-Tack Lee 2007-09-04
7230293 Storage nodes of a semiconductor memory Kun-Tack Lee, Yong-Pil Han 2007-06-12
7216653 Cleaning solution and cleaning method of a semiconductor device Sang-jun Choi, Chang-Ki Hong 2007-05-15
7105475 Cleaning solution and cleaning method of a semiconductor device Sang-jun Choi, Chang-Ki Hong 2006-09-12
7098135 Semiconductor device including bit line formed using damascene technique and method of fabricating the same Seung-Pil Chung, Chang-Jin Kang, Jeong-sic Jeon, Kyeong-Koo Chi, Seung-Young Son 2006-08-29
7029509 CMP slurry composition and a method for planarizing semiconductor device using the same Kwang-Ha Suh, Tae-Kyu Kim, Hwi-Jin Kim 2006-04-18
6921919 Semiconductor device and method of forming the same Ji-Young Kim 2005-07-26
6903024 Method of manufacturing storage nodes of a semiconductor memory device using a two-step etching process Kun-Tack Lee, Yong-Pil Han 2005-06-07
6528290 Candida magnoliae producing mannitol and fermentation method for producing mannitol Kyung Hwa Song, Hong Kil Baek, Song Mi Park, Hyung-Hwan Hyun, Soo Ryun Jung +2 more 2003-03-04
6489651 MOS transistor that inhibits punchthrough 2002-12-03
6316245 Mutant cells of Pichia Deok Kun Oh, Soo Ryun Jung 2001-11-13
6287830 Fermentation process for preparing erythritol by a high salt tolerant mutant of Candida sp. Jin Ho Seo, Yeon Ryu, Soo Ryun Jung 2001-09-11
6270815 Fermentation process for preparing erythritol using mother liquor produced from purification process of palatinose Deok Kun Oh, Bong Soo Noh, Soo Ryun Jung, Kyung Ah Kim 2001-08-07
6200841 MOS transistor that inhibits punchthrough and method for fabricating the same 2001-03-13
6175777 Method for transferring wafer cassettes after checking whether process equipment is in a suitable mode 2001-01-16